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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 20 — Sep. 27, 2010
  • pp: 20620–20627

Direct phase extraction from interferograms with random phase shifts

Jiancheng Xu, Qiao Xu, Liqun Chai, Yong Li, and Hui Wang  »View Author Affiliations


Optics Express, Vol. 18, Issue 20, pp. 20620-20627 (2010)
http://dx.doi.org/10.1364/OE.18.020620


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Abstract

A new method that extracts phase directly from randomly phase-shifted interferograms is proposed. In this method, the background intensity and the modulation amplitude are determined by a temporal method and used as the system parameters and then the phase is extracted from one single interferogram by arc cosine function with range of (0, π). By partitioning the extracted phase distribution into watershed regions and determining the sign of phase in each region, the extracted phase is recovered to its principle phase with range of (–π, π). Numerical simulation and experiment are implemented to verify the effectiveness of this method. The method has applications in both static and dynamic phase measurement.

© 2010 OSA

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 28, 2010
Revised Manuscript: August 26, 2010
Manuscript Accepted: August 27, 2010
Published: September 14, 2010

Citation
Jiancheng Xu, Qiao Xu, Liqun Chai, Yong Li, and Hui Wang, "Direct phase extraction from interferograms with random phase shifts," Opt. Express 18, 20620-20627 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-20-20620


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References

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