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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 21 — Oct. 11, 2010
  • pp: 21705–21713

Influence of substrate configuration on the angular response pattern of infrared antennas

Jeffrey A. Bean, Brian A. Slovick, and Glenn D. Boreman  »View Author Affiliations

Optics Express, Vol. 18, Issue 21, pp. 21705-21713 (2010)

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The far-field angular response pattern for dipole antenna-coupled infrared detectors is investigated. These devices utilize an asymmetric metal-oxide-metal diode that is capable of rectifying infrared-frequency antenna currents without applied bias. Devices are fabricated on both planar and hemispherical lens substrates. Measurements indicate that the angular response can be tailored by the thickness of the electrical isolation standoff layer on which the detector is fabricated and/or the inclusion of a ground plane. Electromagnetic simulations and analytical expressions show excellent agreement with the measured results.

© 2010 OSA

OCIS Codes
(040.3060) Detectors : Infrared
(310.6845) Thin films : Thin film devices and applications
(250.0040) Optoelectronics : Detectors

ToC Category:

Original Manuscript: August 10, 2010
Revised Manuscript: September 21, 2010
Manuscript Accepted: September 22, 2010
Published: September 29, 2010

Jeffrey A. Bean, Brian A. Slovick, and Glenn D. Boreman, "Influence of substrate configuration on the angular response pattern of infrared antennas," Opt. Express 18, 21705-21713 (2010)

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