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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 21 — Oct. 11, 2010
  • pp: 22004–22009

Quantitative evaluation of boron-induced disorder in multilayers containing silicon nanocrystals in an oxide matrix designed for photovoltaic applications

G. Zatryb, A. Podhorodecki, X. J. Hao, J. Misiewicz, Y. S. Shen, and M. A. Green  »View Author Affiliations


Optics Express, Vol. 18, Issue 21, pp. 22004-22009 (2010)
http://dx.doi.org/10.1364/OE.18.022004


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Abstract

The effect of doping by boron on optical properties of multilayers containing Si-NCs were studied by means of photoluminescence (PL), time-resolved PL, photoluminescence excitation (PLE), transmission and reflection measurements. It was found that PL decay is strongly non-single exponential and can be described by means of Laplace transform of log-normal decay rates distribution. It was also proposed that changes observed in the distribution central moments reflect the disorder induced by boron-doping.

© 2010 OSA

OCIS Codes
(300.6500) Spectroscopy : Spectroscopy, time-resolved
(310.4165) Thin films : Multilayer design
(160.4236) Materials : Nanomaterials

ToC Category:
Thin Films

History
Original Manuscript: July 27, 2010
Revised Manuscript: September 8, 2010
Manuscript Accepted: September 8, 2010
Published: October 1, 2010

Citation
G. Zatryb, A. Podhorodecki, X. J. Hao, J. Misiewicz, Y. S. Shen, and M. A. Green, "Quantitative evaluation of boron-induced disorder in multilayers containing silicon nanocrystals in an oxide matrix designed for photovoltaic applications," Opt. Express 18, 22004-22009 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-21-22004


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References

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