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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 21 — Oct. 11, 2010
  • pp: 22147–22157

Twin-photon confocal microscopy

D. S. Simon and A. V. Sergienko  »View Author Affiliations


Optics Express, Vol. 18, Issue 21, pp. 22147-22157 (2010)
http://dx.doi.org/10.1364/OE.18.022147


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Abstract

A recently introduced two-channel confocal microscope with correlated detection promises up to 50% improvement in transverse spatial resolution [Simon, Sergienko, Optics Express 18, 9765 (2010)] via the use of photon correlations. Here we achieve similar results in a different manner, introducing a triple-confocal correlated microscope which exploits the correlations present in optical parametric amplifiers. It is based on tight focusing of pump radiation onto a thin sample positioned in front of a nonlinear crystal, followed by coincidence detection of signal and idler photons, each focused onto a pinhole. This approach offers further resolution enhancement in confocal microscopy.

© 2010 Optical Society of America

OCIS Codes
(180.1790) Microscopy : Confocal microscopy
(180.5810) Microscopy : Scanning microscopy
(190.4970) Nonlinear optics : Parametric oscillators and amplifiers

ToC Category:
Microscopy

History
Original Manuscript: August 30, 2010
Manuscript Accepted: September 19, 2010
Published: October 5, 2010

Virtual Issues
Vol. 5, Iss. 14 Virtual Journal for Biomedical Optics

Citation
D. S. Simon and A. V. Sergienko, "Twin-photon confocal microscopy," Opt. Express 18, 22147-22157 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-21-22147


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References

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