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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 23 — Nov. 8, 2010
  • pp: 23517–23522

Visibility enhanced interferometer based on an injection-locking technique for low reflective materials

Jonghan Jin, Jae Wan Kim, Chu-Shik Kang, and Jong-Ahn Kim  »View Author Affiliations


Optics Express, Vol. 18, Issue 23, pp. 23517-23522 (2010)


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Abstract

We propose and demonstrate a novel method to enhance the visibility of an optical interferometer when measuring low reflective materials. Because of scattering from a rough surface or its own low reflectivity, the visibility of the obtained interference signal is seriously deteriorated. By amplifying the weak light coming from the sample based on an injection-locking technique, the visibility can be enhanced. As a feasibility test, even with a sample having a reflectivity of 0.6%, we obtained almost the same visibility as a metal coated mirror. The suggested visibility enhanced interferometer can be widely used for measuring low reflective materials.

© 2010 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(140.3520) Lasers and laser optics : Lasers, injection-locked

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: September 14, 2010
Revised Manuscript: October 4, 2010
Manuscript Accepted: October 4, 2010
Published: October 25, 2010

Citation
, "Visibility enhanced interferometer based on an injection-locking technique for low reflective materials," Opt. Express 18, 23517-23522 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-23-23517


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