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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 23 — Nov. 8, 2010
  • pp: 23727–23739

Optimisation of phase imaging geometry

B. D. Arhatari and A. G. Peele  »View Author Affiliations


Optics Express, Vol. 18, Issue 23, pp. 23727-23739 (2010)
http://dx.doi.org/10.1364/OE.18.023727


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Abstract

Certain phase retrieval methods use knowledge about the free space propagation of a wave to phase a paraxial beam passing through one or more measurement planes. This approach has been widely applied and has been shown to quantitatively retrieve the refractive index profile of a sample. The quality of the phase retrieval will depend on a range of factors including sample feature size, propagation distance, measurement plane separation, wavelength and noise. Here we describe an optimisation study for two-plane phase retrieval using a laboratory-based X-ray source that considers all of these factors. We discuss our results in the context of a three-dimensional reconstruction of a sample refractive index profile.

© 2010 OSA

OCIS Codes
(100.5070) Image processing : Phase retrieval
(340.0340) X-ray optics : X-ray optics
(340.7440) X-ray optics : X-ray imaging

ToC Category:
X-ray Optics

History
Original Manuscript: August 13, 2010
Revised Manuscript: October 5, 2010
Manuscript Accepted: October 24, 2010
Published: October 27, 2010

Citation
B. D. Arhatari and A. G. Peele, "Optimisation of phase imaging geometry," Opt. Express 18, 23727-23739 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-23-23727


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