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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 23 — Nov. 8, 2010
  • pp: 24368–24378

Phase-shift extraction for phase-shifting interferometry by histogram of phase difference

Jiancheng Xu, Yong Li, Hui Wang, Liqun Chai, and Qiao Xu  »View Author Affiliations

Optics Express, Vol. 18, Issue 23, pp. 24368-24378 (2010)

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We propose a non-iterative approach to extract the unknown phase shift in phase shifting interferometry without the assumption of equal distribution of measured phase in [0,2π]. According to the histogram of the phase difference between two adjacent frames, the phase shift can be accurately extracted by finding the bin of histogram with the highest frequency. The main factors that influence the accuracy of the proposed method are analyzed and discussed, such as the random noise, the quantization bit of CCD, the number of fringe patterns used and the bin width of histogram. Numerical simulations and optical experiments are also implemented to verify the effectiveness of this method.

© 2010 OSA

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 13, 2010
Revised Manuscript: October 21, 2010
Manuscript Accepted: October 21, 2010
Published: November 5, 2010

Jiancheng Xu, Yong Li, Hui Wang, Liqun Chai, and Qiao Xu, "Phase-shift extraction for phase-shifting interferometry by histogram of phase difference," Opt. Express 18, 24368-24378 (2010)

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