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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 25 — Dec. 6, 2010
  • pp: 26417–26429

Analytical description of STED microscopy performance

Marcel Leutenegger, Christian Eggeling, and Stefan W. Hell  »View Author Affiliations

Optics Express, Vol. 18, Issue 25, pp. 26417-26429 (2010)

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Stimulated emission depletion (STED) resolves fluorescent features that are closer than the far-field optical diffraction limit by applying a spatially modulated light field keeping all but one of these features dark consecutively. For estimating the efficiency of transient fluorophore darkening, we developed analytical equations considering the spatio-temporal intensity profile of the STED beam. These equations provide a quick analysis and optimization of the resolution and contrast to be gained under various conditions, such as continuous wave or pulsed STED beams having different pulse durations. Particular emphasis is placed on fluorescence fluctuation methods such as correlation spectroscopy (FCS) using STED.

© 2010 OSA

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(180.2520) Microscopy : Fluorescence microscopy
(260.2510) Physical optics : Fluorescence

ToC Category:

Original Manuscript: October 19, 2010
Revised Manuscript: November 22, 2010
Manuscript Accepted: November 25, 2010
Published: December 1, 2010

Marcel Leutenegger, Christian Eggeling, and Stefan W. Hell, "Analytical description of STED microscopy performance," Opt. Express 18, 26417-26429 (2010)

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