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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 3 — Feb. 1, 2010
  • pp: 2325–2331

Near field imaging with resonant cavity lens

Guixin Li, Jensen Li, H. L. Tam, C. T. Chan, and K. W. Cheah  »View Author Affiliations


Optics Express, Vol. 18, Issue 3, pp. 2325-2331 (2010)
http://dx.doi.org/10.1364/OE.18.002325


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Abstract

We showed that a Ag-SiO2-Ag Fabry-Pérot cavity can be used in near-field imaging based on omnidirectional resonance tunneling. The omnidirectional resonance was experimentally demonstrated in the Ag-SiO2-Ag resonant cavity working at a wavelength of 365 nm. The resonant cavity lens with high transmittance and high image fidelity was fabricated using standard photolithography method. Grating source with 190 nm line resolution was imaged through the resonant cavity lens with a total thickness of 128 nm.

© 2010 OSA

OCIS Codes
(260.2110) Physical optics : Electromagnetic optics
(250.5403) Optoelectronics : Plasmonics
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Imaging Systems

History
Original Manuscript: November 18, 2009
Revised Manuscript: January 13, 2010
Manuscript Accepted: January 14, 2010
Published: January 21, 2010

Citation
Guixin Li, Jensen Li, H. L. Tam, C. T. Chan, and K. W. Cheah, "Near field imaging with resonant cavity lens," Opt. Express 18, 2325-2331 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-3-2325


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