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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 4 — Feb. 15, 2010
  • pp: 3938–3945

Simultaneous multi-impairment monitoring of 640 Gb/s signals using photonic chip based RF spectrum analyzer

T. D. Vo, M. D. Pelusi, J. Schröder, F. Luan, S. J. Madden, D.-Y. Choi, D. A. P. Bulla, B. Luther-Davies, and B. J. Eggleton  »View Author Affiliations

Optics Express, Vol. 18, Issue 4, pp. 3938-3945 (2010)

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We report the first demonstration of simultaneous multi-impairment monitoring at ultrahigh bitrates using a THz bandwidth photonic-chip-based radio-frequency (RF) spectrum analyzer. Our approach employs a 7 cm long, highly nonlinear (γ ≈9900 /W/km), dispersion engineered chalcogenide planar waveguide to capture the RF spectrum of an ultrafast 640 Gb/s signal, based on cross-phase modulation, from which we numerically retrieve the autocorrelation waveform. The relationship between the retrieved autocorrelation trace and signal impairments is exploited to simultaneously monitor dispersion, in-band optical signal to noise ratio (OSNR) and timing jitter from a single measurement. This novel approach also offers very high OSNR measurement dynamic range (> 30 dB) and is scalable to terabit data rates.

© 2010 OSA

OCIS Codes
(070.4340) Fourier optics and signal processing : Nonlinear optical signal processing
(190.4360) Nonlinear optics : Nonlinear optics, devices
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

ToC Category:
Nonlinear Optics

Original Manuscript: November 11, 2009
Revised Manuscript: January 28, 2010
Manuscript Accepted: February 9, 2010
Published: February 12, 2010

T. D. Vo, M. D. Pelusi, J. Schröder, F. Luan, S. J. Madden, D.-Y. Choi, D. A. P. Bulla, B. Luther-Davies, and B. J. Eggleton, "Simultaneous multi-impairment monitoring of 640 Gb/s signals using photonic chip based RF spectrum analyzer," Opt. Express 18, 3938-3945 (2010)

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