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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 5 — Mar. 1, 2010
  • pp: 4023–4040

Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theory

Glen D. Gillen, Christopher M. Seck, and Shekhar Guha  »View Author Affiliations

Optics Express, Vol. 18, Issue 5, pp. 4023-4040 (2010)

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Vector diffraction theory is applied to the case of focused TEM00 Gaussian beams passing through a spatially limiting aperture in order to investigate the propagation of these clipped focused-Gaussian beams. Beam distributions at different axial distances show that a traditional M2 propagation model cannot be used for the propagation of clipped focus-Gaussian beams. Using Luneberg’s vector diffraction theory and Fresnel approximations, an analytical model for the on-axis transverse and longitudinal electric fields and intensity distributions is presented including predictions of the maximum obtainable intensity. In addition, an analytical expression is provided for the longitudinal component of the electric field of a TEM00 mode unperturbed Gaussian beam. Experimental results are also presented and compared to the model’s predictions.

© 2010 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(050.1960) Diffraction and gratings : Diffraction theory
(220.2560) Optical design and fabrication : Propagating methods

ToC Category:
Diffraction and Gratings

Original Manuscript: December 21, 2009
Revised Manuscript: February 7, 2010
Manuscript Accepted: February 9, 2010
Published: February 16, 2010

Glen D. Gillen, Christopher M. Seck, and Shekhar Guha, "Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theory," Opt. Express 18, 4023-4040 (2010)

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