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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 5 — Mar. 1, 2010
  • pp: 5124–5134

Ultra-thin ultra-smooth and low-loss silver films on a germanium wetting layer

Weiqiang Chen, Mark D. Thoreson, Satoshi Ishii, Alexander V. Kildishev, and Vladimir M. Shalaev  »View Author Affiliations


Optics Express, Vol. 18, Issue 5, pp. 5124-5134 (2010)
http://dx.doi.org/10.1364/OE.18.005124


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Abstract

We demonstrate a method to fabricate ultra-thin, ultra-smooth and low-loss silver (Ag) films using a very thin germanium (Ge) layer as a wetting material and a rapid post-annealing treatment. The addition of a Ge wetting layer greatly reduces the surface roughness of Ag films deposited on a glass substrate by electron-beam evaporation. The percolation threshold of Ag films and the minimal thickness of a uniformly continuous Ag film were significantly reduced using a Ge wetting layer in the fabrication. A rapid post-annealing treatment is demonstrated to reduce the loss of the ultra-thin Ag film to the ideal values allowed by the quantum size effect in smaller grains. Using the same wetting method, we have also extended our studies to ultra-smooth silver-silica lamellar composite films with ultra-thin Ag sublayers.

© 2010 OSA

OCIS Codes
(160.3900) Materials : Metals
(240.0310) Optics at surfaces : Thin films
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

History
Original Manuscript: December 1, 2009
Revised Manuscript: December 24, 2009
Manuscript Accepted: January 5, 2010
Published: February 25, 2010

Citation
Weiqiang Chen, Mark D. Thoreson, Satoshi Ishii, Alexander V. Kildishev, and Vladimir M. Shalaev, "Ultra-thin ultra-smooth and low-loss silver films on a germanium wetting layer," Opt. Express 18, 5124-5134 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-5-5124


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