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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 5 — Mar. 1, 2010
  • pp: 5229–5244

Dual-frequency pattern scheme for high-speed 3-D shape measurement

Kai Liu, Yongchang Wang, Daniel L. Lau, Qi Hao, and Laurence G. Hassebrook  »View Author Affiliations

Optics Express, Vol. 18, Issue 5, pp. 5229-5244 (2010)

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A novel dual-frequency pattern is developed which combines a high-frequency sinusoid component with a unit-frequency sinusoid component, where the high-frequency component is used to generate robust phase information, and the unit-frequency component is used to reduce phase unwrapping ambiguities. With our proposed pattern scheme, phase unwrapping can overcome the major shortcomings of conventional spatial phase unwrapping: phase jumping and discontinuities. Compared with conventional temporal phase unwrapped approaches, the proposed pattern scheme can achieve higher quality phase data using a less number of patterns. To process data in real time, we also propose and develop look-up table based fast and accurate algorithms for phase generation and 3-D reconstruction. Those fast algorithms can be applied to our pattern scheme as well as traditional phase measuring profilometry. For a 640×480 video stream, we can generate phase data at 1063.8 frames per second and full 3-D coordinate point clouds at 228.3 frames per second. These achievements are 25 and 10 times faster than previously reported studies.

© 2010 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(150.5670) Machine vision : Range finding
(150.6910) Machine vision : Three-dimensional sensing
(150.0155) Machine vision : Machine vision optics
(150.1135) Machine vision : Algorithms

ToC Category:
Machine Vision

Original Manuscript: December 14, 2009
Revised Manuscript: January 19, 2010
Manuscript Accepted: February 12, 2010
Published: February 26, 2010

Kai Liu, Yongchang Wang, Daniel L. Lau, Qi Hao, and Laurence G. Hassebrook, "Dual-frequency pattern scheme for high-speed 3-D shape measurement," Opt. Express 18, 5229-5244 (2010)

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