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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 6 — Mar. 15, 2010
  • pp: 5609–5628

Far-field polarization-based sensitivity to sub-resolution displacements of a sub-resolution scatterer in tightly focused fields

Oscar G. Rodríguez-Herrera, David Lara, and Chris Dainty  »View Author Affiliations

Optics Express, Vol. 18, Issue 6, pp. 5609-5628 (2010)

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We present a system built to perform measurements of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture collector lens. These distributions contain information about the three-dimensional electromagnetic field that results from the interaction of a tightly focused field and a sub-resolution scatterer. Experimental evidence proving that the system allows for high polarization-dependent sensitivity to sub-resolution displacements of a sub-resolution scatterer is provided together with the corresponding numerical results.

© 2010 OSA

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization
(290.5820) Scattering : Scattering measurements

ToC Category:

Original Manuscript: February 9, 2010
Revised Manuscript: February 27, 2010
Manuscript Accepted: February 28, 2010
Published: March 3, 2010

Oscar G. Rodríguez-Herrera, David Lara, and Chris Dainty, "Far-field polarization-based sensitivity to sub-resolution displacements of a sub-resolution scatterer in tightly focused fields," Opt. Express 18, 5609-5628 (2010)

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