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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 6 — Mar. 15, 2010
  • pp: 6048–6055

Far-field measurement of ultra-small plasmonic mode volume

Shuang Zhang, Yong-Shik Park, Yongmin Liu, Thomas Zentgraf, and Xiang Zhang  »View Author Affiliations


Optics Express, Vol. 18, Issue 6, pp. 6048-6055 (2010)
http://dx.doi.org/10.1364/OE.18.006048


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Abstract

Light-matter interaction can be greatly enhanced in nano-scale plasmonic cavities with tightly confined optical mode, where the mode volume determines the interaction strength. The experimental determination of the mode volume of plasmonic elements is therefore of fundamental importance. Mapping the electric field distribution using near-field scanning optical microscopy (NSOM) may disturb the field distribution hence prevent a reliable measurement of the mode volume. Here, we develop a non-pertubative technique to experimentally determine the mode volume of plasmonic resonators in the far field through a unique optical force method.

© 2010 OSA

OCIS Codes
(250.5403) Optoelectronics : Plasmonics
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Optics at Surfaces

History
Original Manuscript: November 30, 2009
Revised Manuscript: January 18, 2010
Manuscript Accepted: February 10, 2010
Published: March 11, 2010

Citation
Shuang Zhang, Yong-Shik Park, Yongmin Liu, Thomas Zentgraf, and Xiang Zhang, "Far-field measurement of ultra-small plasmonic mode volume," Opt. Express 18, 6048-6055 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-6-6048


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