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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 6 — Mar. 15, 2010
  • pp: 6366–6381

A multipole-expansion based linear sampling method for solving inverse scattering problems

Krishna Agarwal, Xudong Chen, and Yu Zhong  »View Author Affiliations

Optics Express, Vol. 18, Issue 6, pp. 6366-6381 (2010)

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Linear sampling method (LSM) is a qualitative method used to reconstruct the support of scatterers. This paper presents a modification of the LSM approach. The proposed method analyses the multipole expansion of the scattered field. Only monopole and dipole terms are used for the reconstruction of the scatterer support and all other higher order multipoles are truncated. It is shown that such modification performs better than the mathematical regularization typically used in LSM. The justification for truncation of higher order multipoles is presented. Various examples are presented to demonstrate the performance of the proposed method for dielectric as well as perfectly conducting scatterers in presence of significant amount of additive Gaussian noise.

© 2010 Optical Society of America

OCIS Codes
(260.2110) Physical optics : Electromagnetic optics
(290.3200) Scattering : Inverse scattering
(290.5825) Scattering : Scattering theory

ToC Category:
Physical Optics

Original Manuscript: January 19, 2010
Manuscript Accepted: March 1, 2010
Published: March 12, 2010

Krishna Agarwal, Xudong Chen, and Yu Zhong, "A multipole-expansion based linear sampling method for solving inverse scattering problems," Opt. Express 18, 6366-6381 (2010)

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