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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 7 — Mar. 29, 2010
  • pp: 6583–6597

Measuring temporally complex ultrashort pulses using multiple-delay crossed-beam spectral interferometry

Jacob Cohen, Pamela Bowlan, Vikrant Chauhan, and Rick Trebino  »View Author Affiliations


Optics Express, Vol. 18, Issue 7, pp. 6583-6597 (2010)
http://dx.doi.org/10.1364/OE.18.006583


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Abstract

We introduce a spectral-interferometry (SI) technique for measuring the complete intensity and phase of relatively long and very complex ultrashort pulses. Ordinarily, such a method would require a high-resolution spectrometer, but our method overcomes this need. It involves making multiple measurements using SI (in its SEA TADPOLE variation) at numerous delays, measuring many temporal pulselets within the pulse, and concatenating the resulting pulselets. Its spectral resolution is the inverse delay range—many times higher than that of the spectrometer used. Our simple proof-of-principle implementation of it provided 71 fs temporal resolution and a temporal range of 100 ps using a few-cm low-resolution spectrometer.

© 2010 OSA

OCIS Codes
(320.0320) Ultrafast optics : Ultrafast optics
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

History
Original Manuscript: January 26, 2010
Revised Manuscript: March 9, 2010
Manuscript Accepted: March 11, 2010
Published: March 15, 2010

Citation
Jacob Cohen, Pamela Bowlan, Vikrant Chauhan, and Rick Trebino, "Measuring temporally complex ultrashort pulses using multiple-delay crossed-beam spectral interferometry," Opt. Express 18, 6583-6597 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-7-6583


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