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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 7 — Mar. 29, 2010
  • pp: 6598–6603

Investigation on the role of the dielectric loss in metamaterial absorber

ChengGang Hu, Xiong Li, Qin Feng, Xu’Nan Chen, and XianGang Luo  »View Author Affiliations


Optics Express, Vol. 18, Issue 7, pp. 6598-6603 (2010)
http://dx.doi.org/10.1364/OE.18.006598


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Abstract

The authors report a metamaterial (MM) consisting of cut-wire structures which shows near-perfect absorption at microwave frequencies. Experimental results show slight lower performance than simulation. The analysis of the spectra and retrieved electromagnetic parameters demonstrate that the mismatch is attributed to the considerable influence of the dielectric loss on the strength of the electric and magnetic resonances, which largely determines the ability of the MM absorber. Such dependence on dielectric loss provides an important clue for the design of MM absorber aiming at specific applications where high efficiency energy collection in dielectric is needed.

© 2010 OSA

OCIS Codes
(260.5740) Physical optics : Resonance
(160.3918) Materials : Metamaterials

ToC Category:
Metamaterials

History
Original Manuscript: January 26, 2010
Revised Manuscript: March 2, 2010
Manuscript Accepted: March 5, 2010
Published: March 15, 2010

Citation
ChengGang Hu, Xiong Li, Qin Feng, Xu’Nan Chen, and XianGang Luo, "Investigation on the role of the dielectric loss in metamaterial absorber," Opt. Express 18, 6598-6603 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-7-6598


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