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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 7 — Mar. 29, 2010
  • pp: 6667–6685

High accuracy polarization measurements using binary polarization rotators

X. Steve Yao, Xiaojun Chen, and Tiegen Liu  »View Author Affiliations


Optics Express, Vol. 18, Issue 7, pp. 6667-6685 (2010)
http://dx.doi.org/10.1364/OE.18.006667


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Abstract

We report a novel system for the accurate measurement of all polarization related parameters, including polarization mode dispersion and polarization dependent loss, using binary magneto-optic polarization rotators. By taking advantage of the binary nature of the rotators, we achieved unprecedented DGD, SOPMD, and PDL accuracies of 2.6 fs, 1.39ps2, and 0.06 dB respectively; repeatabilities of 0.022 fs, 0.28 ps2, and 0.034dB respectively; and resolutions of 1 fs, 0.005 ps2 and 0.01dB respectively, from 1480 to 1620 nm.

© 2010 OSA

OCIS Codes
(060.2300) Fiber optics and optical communications : Fiber measurements
(080.2730) Geometric optics : Matrix methods in paraxial optics
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 25, 2010
Manuscript Accepted: February 21, 2010
Published: March 16, 2010

Citation
X. Steve Yao, Xiaojun Chen, and Tiegen Liu, "High accuracy polarization measurements using binary polarization rotators," Opt. Express 18, 6667-6685 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-7-6667


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