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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 7 — Mar. 29, 2010
  • pp: 6877–6884

Ultrashort pulse measurements by interferometric spectrogram

Li-Fan Yang, Shih-Lun Lin, and Shang-Da Yang  »View Author Affiliations


Optics Express, Vol. 18, Issue 7, pp. 6877-6884 (2010)
http://dx.doi.org/10.1364/OE.18.006877


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Abstract

We experimentally demonstrate that an interferometric spectrogram (i.e., fringe- and frequency-resolved autocorrelation trace) with high signal-to-noise ratio can be processed by three different procedures to accurately retrieve the spectral phase profile. We also show that the data redundancy built in the interferometric spectrogram permits simultaneous retrieval of multiple spectral phase solutions, and their weighted average may give a highly robust result against the measurement noise.

© 2010 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

ToC Category:
Ultrafast Optics

History
Original Manuscript: February 4, 2010
Revised Manuscript: March 5, 2010
Manuscript Accepted: March 9, 2010
Published: March 18, 2010

Citation
Li-Fan Yang, Shih-Lun Lin, and Shang-Da Yang, "Ultrashort pulse measurements by interferometric spectrogram," Opt. Express 18, 6877-6884 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-7-6877


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