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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 7 — Mar. 29, 2010
  • pp: 7253–7262

Coherent diffraction surface imaging in reflection geometry

Shashidhara Marathe, S. S. Kim, S. N. Kim, Chan Kim, H. C. Kang, P. V. Nickles, and D. Y. Noh  »View Author Affiliations


Optics Express, Vol. 18, Issue 7, pp. 7253-7262 (2010)
http://dx.doi.org/10.1364/OE.18.007253


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Abstract

We present a reflection based coherent diffraction imaging method which can be used to reconstruct a non periodic surface image from a diffraction amplitude measured in reflection geometry. Using a He-Ne laser, we demonstrated that a surface image can be reconstructed solely from the reflected intensity from a surface without relying on any prior knowledge of the sample object or the object support. The reconstructed phase image of the exit wave is particularly interesting since it can be used to obtain quantitative information of the surface depth profile or the phase change during the reflection process. We believe that this work will broaden the application areas of coherent diffraction imaging techniques using light sources with limited penetration depth.

© 2010 OSA

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(100.5070) Image processing : Phase retrieval
(110.1650) Imaging systems : Coherence imaging

ToC Category:
Imaging Systems

History
Original Manuscript: January 5, 2010
Revised Manuscript: February 26, 2010
Manuscript Accepted: March 17, 2010
Published: March 24, 2010

Citation
Shashidhara Marathe, S. S. Kim, S. N. Kim, Chan Kim, H. C. Kang, P. V. Nickles, and D. Y. Noh, "Coherent diffraction surface imaging in reflection geometry," Opt. Express 18, 7253-7262 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-7-7253


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