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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 8 — Apr. 12, 2010
  • pp: 7575–7583

Patterning of Flexible Organic Light Emitting Diode (FOLED) stack using an ultrafast laser

Rajesh Mandamparambil, Henri Fledderus, Geert Van Steenberge, and Andreas Dietzel  »View Author Affiliations

Optics Express, Vol. 18, Issue 8, pp. 7575-7583 (2010)

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A femtosecond laser has been successfully utilized for patterning thin Flexible Organic Light Emitting Diode (FOLED) structures of individual layer thickness around 100nm. The authors report in this paper a step-like ablation behavior at the layer interfaces which accounts for a local removal of entire layers. Various surface analyzing techniques are used to investigate the morphologies and chemical compositions within and in the vicinity of the ablation areas. This study opens a new avenue in selectively ablating different layers from a multilayer stack on flexible substrates using fs lasers allowing post deposition structuring of large area flexible organic electronic devices.

© 2010 OSA

OCIS Codes
(320.2250) Ultrafast optics : Femtosecond phenomena
(350.3850) Other areas of optics : Materials processing

ToC Category:
Optical Devices

Original Manuscript: January 15, 2010
Revised Manuscript: March 2, 2010
Manuscript Accepted: March 3, 2010
Published: March 29, 2010

Rajesh Mandamparambil, Henri Fledderus, Geert Van Steenberge, and Andreas Dietzel, "Patterning of Flexible Organic Light Emitting Diode (FOLED) stack using an ultrafast laser," Opt. Express 18, 7575-7583 (2010)

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