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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 8 — Apr. 12, 2010
  • pp: 7899–7904

Direct calibration of a spatial light modulator by lateral shearing interferometry

Flávio P. Ferreira and Michael S. Belsley  »View Author Affiliations


Optics Express, Vol. 18, Issue 8, pp. 7899-7904 (2010)
http://dx.doi.org/10.1364/OE.18.007899


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Abstract

A new interferometric technique is described to measure the complex modulation curve of a spatial light modulator. Based on a lateral shear imaging interferometer, it enables the amplitude and phase modulation for several modulation levels to be displayed simultaneously in a single interferogram. As an example of the power of this technique a heuristic optimization of input and output elliptical polarization states for a mostly-phase operation mode was obtained within a few minutes for a commercial twisted-nematic liquid crystal display.

© 2010 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(230.3720) Optical devices : Liquid-crystal devices
(230.6120) Optical devices : Spatial light modulators

ToC Category:
Optical Devices

History
Original Manuscript: January 21, 2010
Revised Manuscript: March 1, 2010
Manuscript Accepted: March 2, 2010
Published: March 31, 2010

Citation
Flávio P. Ferreira and Michael S. Belsley, "Direct calibration of a spatial light modulator by lateral shearing interferometry," Opt. Express 18, 7899-7904 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-8-7899


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