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Monolithic integration and synchronous operation of germanium photodetectors and silicon variable optical attenuators
Sungbong Park, Tai Tsuchizawa, Toshifumi Watanabe, Hiroyuki Shinojima, Hidetaka Nishi, Koji Yamada, Yasuhiko Ishikawa, Kazumi Wada, and Seiichi Itabashi »View Author Affiliations
1NTT Microsystem Integration Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa, 243-0198, Japan
2Department of Materials Engineering, The University of Tokyo, Hongo 7-3-1, Bunkyo, Tokyo 113-8656, Japan
*Corresponding author: psbong@aecl.ntt.co.jp
Optics Express, Vol. 18, Issue 8, pp. 8412-8421 (2010)
http://dx.doi.org/10.1364/OE.18.008412
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Abstract
We demonstrate the monolithic integration of germanium (Ge) p-i-n photodetector (PDs) with silicon (Si) variable optical attenuator (VOAs) based on submicrometer Si rib waveguide. A PD is connected to a VOA along the waveguide via a tap coupler. The PDs exhibit low dark current of ~60 nA and large responsivity of ~0.8 A/W at the reverse bias of 1 V at room temperature. These characteristics are uniform over the chip scale. The PDs generate photocurrents precisely with respect to DC optical power attenuated by the VOAs. Two devices work synchronously for modulated optical signals as well. 3-dB cut-off frequency of the VOA is ~100 MHz, while that of the PD is ~1 GHz. The synchronous response speed is limited by the VOA response speed. This is the first demonstration, to the best of our knowledge, of monolithic integration of Ge PDs with high-carrier-injection-based optical modulation devices based on Si.
© 2010 OSA
OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(230.5160) Optical devices : Photodetectors
(230.7370) Optical devices : Waveguides
ToC Category:
Integrated Optics
History
Original Manuscript: February 19, 2010
Revised Manuscript: March 30, 2010
Manuscript Accepted: March 31, 2010
Published: April 6, 2010
Citation
Sungbong Park, Tai Tsuchizawa, Toshifumi Watanabe, Hiroyuki Shinojima, Hidetaka Nishi, Koji Yamada, Yasuhiko Ishikawa, Kazumi Wada, and Seiichi Itabashi, "Monolithic integration and synchronous operation of germanium photodetectors and silicon variable optical attenuators," Opt. Express 18, 8412-8421 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-8-8412
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References
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- Z. Huang, J. Oh, S. K. Banerjee, and J. C. Campbell, “Effectiveness of SiGe buffer layers in reducing dark currents of Ge-on-Si photodetectors,” IEEE J. Quantum Electron. 43(3), 238–242 (2007). [CrossRef]
- J. Liu, J. Michel, W. Giziewicz, D. Pan, K. Wada, D. D. Cannon, S. Jongthammanurak, D. T. Danielson, L. C. Kimerling, J. Chen, F. Ö. Ilday, F. X. Kärtner, and J. Yasaitis, “High-performance, tensile-strained Ge p-i-n photodetectors on a Si platform,” Appl. Phys. Lett. 87(10), 103501 (2005). [CrossRef]
- S. Park, Y. Ishikawa, K. Wada, Y. Tsusaka, and J. Matsui, “Strain and absorption coefficient of finite Ge structures on Si,” Jpn. J. Appl. Phys. 48(6), 064501 (2009). [CrossRef]
- S. Park, Y. Ishikawa, T. Tsuchizawa, T. Watanabe, K. Yamada, S. Itabashi, and K. Wada, ““Effect of post-growth annealing on morphology of Ge mesa selectively grown on Si,” IEICE Trans. Electron,” E 91-C, 181 (2008).
- S. Park, Y. Ishikawa, T. Tsuchizawa, T. Watanabe, K. Yamada, S. Itabashi, and K. Wada, ““Effect of post-growth annealing on morphology of Ge mesa selectively grown on Si,” IEICE Trans. Electron,” E 91-C, 181 (2008).
- T. Tsuchizawa, K. Yamada, H. Fukuda, T. Watanabe, J. Takahashi, M. Takahashi, T. Shoji, E. Tamechika, S. Itabashi, and H. Morita, “Microphotonics devices based on silicon microfabrication technology,” IEEE J. Sel. Top. Quantum Electron. 11(1), 232–240 (2005). [CrossRef]
- K. Yamada, T. Tsuchizawa, T. Watanabe, J. Takahashi, E. Tamechika, M. Takahashi, S. Uchiyama, H. Fukuda, T. Shoji, S. Itabashi, and H. Morita, ““Microphotonics devices Based on silicon wire waveguiding system,” IEICE Trans. Electron,” E 87-C, 351 (2004).
- H. Nishi, T. Tsuchizawa, T. Watanabe, H. Shinojima, K. Yamada, and S. Itabashi, “Compact and polarization-independent variable optical attenuator based on a silicon wire waveguide with a carrier injection Structure,” Jpn. J. Appl. Phys. (to be published).
- J. Liu, J. Michel, W. Giziewicz, D. Pan, K. Wada, D. D. Cannon, S. Jongthammanurak, D. T. Danielson, L. C. Kimerling, J. Chen, F. Ö. Ilday, F. X. Kärtner, and J. Yasaitis, “High-performance, tensile-strained Ge p-i-n photodetectors on a Si platform,” Appl. Phys. Lett. 87(10), 103501 (2005). [CrossRef]
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- H. Luan, D. R. Lim, K. K. Lee, K. M. Chen, J. G. Sandland, K. Wada, and L. C. Kimerling, “High-quality Ge epilayers on Si with low threading-dislocation densities,” Appl. Phys. Lett. 75(19), 2909 (1999). [CrossRef]
E
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- S. Nishihara, M. Nakamura, K. Nishimura, K. Kishine, S. Kimura, and K. Kato, “10.3 Gbit/s burst-mode PIN-TIA module with high sensitivity, wide dynamic range and quick response,” Electron. Lett. 44(3), 222 (2008). [CrossRef]
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- K. Yamada, T. Tsuchizawa, T. Watanabe, J. Takahashi, E. Tamechika, M. Takahashi, S. Uchiyama, H. Fukuda, T. Shoji, S. Itabashi, and H. Morita, ““Microphotonics devices Based on silicon wire waveguiding system,” IEICE Trans. Electron,” E 87-C, 351 (2004).
- H. Luan, D. R. Lim, K. K. Lee, K. M. Chen, J. G. Sandland, K. Wada, and L. C. Kimerling, “High-quality Ge epilayers on Si with low threading-dislocation densities,” Appl. Phys. Lett. 75(19), 2909 (1999). [CrossRef]
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- A. A. de Albuquerque, A. J. N. Houghton, and S. Malmros, “Field trials for fiber access in the EC,” IEEE Commun. Mag. 32(2), 40–48 (1994). [CrossRef]
- C. K. Tang, G. T. Reed, A. J. Walton, and A. G. Rickman, “Low-loss, single-model optical phase modulator in SIMOX material,” J. Lightwave Technol. 12(8), 1394–1400 (1994). [CrossRef]
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