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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 9 — Apr. 26, 2010
  • pp: 8743–8758

Positioning and localization of two-wavelength interferograms for wavefront reconstruction with volume holographic media

Eduardo Acedo Barbosa  »View Author Affiliations

Optics Express, Vol. 18, Issue 9, pp. 8743-8758 (2010)

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This work studies both theoretically and experimentally the formation of the contour interference patterns generated by a two-wavelength real-time holographic interferometer. The resulting contour interference fringes are due to the intersection of the measured surface with parallel, equally spaced planes of constant elevation. The theoretical analysis describes how the spatial frequency of the elevation planes, their angular position, and the localization of the fringes depend on parameters of the optical setup. A theoretical model for fringe localization is developed and confirmed by the experiments, showing a strong dependence of the interferogram position on the slope of the studied surface. Due to the thick Bi12TiO20 crystal employed as the storage medium the Bragg selectivity of the holographic readout is also considered.

© 2010 OSA

OCIS Codes
(090.2880) Holography : Holographic interferometry
(090.7330) Holography : Volume gratings
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(160.5320) Materials : Photorefractive materials

ToC Category:

Original Manuscript: December 23, 2009
Revised Manuscript: February 19, 2010
Manuscript Accepted: February 22, 2010
Published: April 12, 2010

Eduardo Acedo Barbosa, "Positioning and localization of two-wavelength
interferograms for wavefront reconstruction 
with volume holographic media," Opt. Express 18, 8743-8758 (2010)

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