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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 9 — Apr. 26, 2010
  • pp: 8942–8947

The oriented spatial filter masks for electronic speckle pattern interferometry phase patterns

Chen Tang, Tao Gao, Si Yan, Linlin Wang, and Jian Wu  »View Author Affiliations

Optics Express, Vol. 18, Issue 9, pp. 8942-8947 (2010)

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we propose the oriented spatial filter masks for filtering in electronic speckle pattern interferometry (ESPI) phase fringe patterns. We establish the oriented derivative operator that only highlights noise without edges of an image. The noise in the image can be removed while still preserving the edges simply by subtracting the oriented derivative image from original image, which can be implemented with one pass of the oriented spatial filter mask. Further, we make an improvement on the oriented spatial filter mask for enhancing the smoothness. The performance of the oriented spatial filter masks is demonstrated via application to a simulated speckle phase fringe pattern and an experimentally obtained phase fringe pattern and comparison with other directional filtering methods.

© 2010 OSA

OCIS Codes
(110.6150) Imaging systems : Speckle imaging
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: January 29, 2010
Revised Manuscript: March 11, 2010
Manuscript Accepted: April 8, 2010
Published: April 14, 2010

Chen Tang, Tao Gao, Si Yan, Linlin Wang, and Jian Wu, "The oriented spatial filter masks for electronic speckle pattern interferometry phase patterns," Opt. Express 18, 8942-8947 (2010)

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