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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 9 — Apr. 26, 2010
  • pp: 9429–9434

Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, Tae Bong Eom, Jung Jin Ju, and Myoungsik Cha  »View Author Affiliations

Optics Express, Vol. 18, Issue 9, pp. 9429-9434 (2010)

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We developed an accurate and efficient method for measuring the refractive indices of a transparent plate by analyzing the transmitted intensity versus angle of incidence. By using two different wavelengths, we resolved the 2π-ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty of 10−5. The validity and the accuracy of our method were confirmed with a standard reference material. Furthermore, our method is insensitive to environmental perturbations, and simple to implement, compared to the conventional index measurement methods providing similar accuracy.

© 2010 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5710) Instrumentation, measurement, and metrology : Refraction

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 9, 2010
Revised Manuscript: March 26, 2010
Manuscript Accepted: April 18, 2010
Published: April 21, 2010

Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, Tae Bong Eom, Jung Jin Ju, and Myoungsik Cha, "Measurement of refractive index and thickness of transparent plate by dual-wavelength interference," Opt. Express 18, 9429-9434 (2010)

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