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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 1 — Jan. 3, 2011
  • pp: 118–127

Integrated spectrometer design with application to multiphoton microscopy

Eric V. Chandler, Charles G. Durfee, and Jeffrey A. Squier  »View Author Affiliations


Optics Express, Vol. 19, Issue 1, pp. 118-127 (2011)
http://dx.doi.org/10.1364/OE.19.000118


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Abstract

We present a prism-based spectrometer integrated into a multifocal, multiphoton microscope. The multifocal configuration facilitates interrogation of samples under different excitation conditions. Notably, the image plane of the microscope and the image plane of the spectrometer are coincident eliminating the need for an intermediate image plane containing an entrance slit. An EM-CCD detector provides sufficient gain for spectral interrogation of single-emitters. We employ this spectrometer to observe spectral shifts in the two-photon excitation fluorescence emission of single CdSe nanodots as a function of excitation polarization.

© 2011 OSA

OCIS Codes
(300.6190) Spectroscopy : Spectrometers
(300.6410) Spectroscopy : Spectroscopy, multiphoton
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:
Spectroscopy

History
Original Manuscript: November 8, 2010
Revised Manuscript: December 10, 2010
Manuscript Accepted: December 13, 2010
Published: December 21, 2010

Virtual Issues
Vol. 6, Iss. 2 Virtual Journal for Biomedical Optics

Citation
Eric V. Chandler, Charles G. Durfee, and Jeffrey A. Squier, "Integrated spectrometer design with application to multiphoton microscopy," Opt. Express 19, 118-127 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-1-118


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