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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 10 — May. 9, 2011
  • pp: 9336–9344

Precise in-situ measurement of laser pulse intensity using strong field ionization

C. Smeenk, J. Z. Salvail, L. Arissian, P. B. Corkum, C. T. Hebeisen, and A. Staudte  »View Author Affiliations

Optics Express, Vol. 19, Issue 10, pp. 9336-9344 (2011)

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Building on the work of Alnaser et al. [Phys. Rev. A 70, 023413 (2004)], we devise an improved method for an in-situ measurement of the peak intensity in a focused, femtosecond infrared laser pulse. The method is shown to be effective with both photoion and photoelectron imaging devices. The model used to fit the experimental data has no unphysical free parameters used in fitting. The accuracy of the fit is 4% and the overall accuracy of the measurement is 8%.

© 2011 OSA

OCIS Codes
(190.4180) Nonlinear optics : Multiphoton processes
(190.7110) Nonlinear optics : Ultrafast nonlinear optics

ToC Category:
Nonlinear Optics

Original Manuscript: January 27, 2011
Revised Manuscript: March 18, 2011
Manuscript Accepted: March 19, 2011
Published: April 28, 2011

C. Smeenk, J. Z. Salvail, L. Arissian, P. B. Corkum, C. T. Hebeisen, and A. Staudte, "Precise in-situ measurement of laser pulse intensity using strong field ionization," Opt. Express 19, 9336-9344 (2011)

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