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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 10 — May. 9, 2011
  • pp: 9582–9593

Measuring the feedback parameter of a semiconductor laser with external optical feedback

Yanguang Yu, Jiangtao Xi, and Joe F. Chicharo  »View Author Affiliations


Optics Express, Vol. 19, Issue 10, pp. 9582-9593 (2011)
http://dx.doi.org/10.1364/OE.19.009582


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Abstract

Feedback parameter (the C factor) is an important parameter for a semiconductor laser operating in the regime of external optical feedback. Self-mixing interferometry (SMI) has been proposed for the measurement of the parameter, based on the time-domain analysis of the output power waveforms (called SMI signals) in presence of feedback. However, the existing approaches only work for a limited range of C, below about 3.5. This paper presents a new method to measure C based on analysis of the phase signal of SMI signals in the frequency domain. The proposed method covers a large range of C values, up to about 10. Simulations and experimental results are presented for verification of the proposed method.

© 2011 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.5960) Lasers and laser optics : Semiconductor lasers
(280.3420) Remote sensing and sensors : Laser sensors

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: March 18, 2011
Revised Manuscript: April 24, 2011
Manuscript Accepted: April 26, 2011
Published: May 2, 2011

Citation
Yanguang Yu, Jiangtao Xi, and Joe F. Chicharo, "Measuring the feedback parameter of a semiconductor laser with external optical feedback," Opt. Express 19, 9582-9593 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-10-9582


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