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Partially coherent nano-focused x-ray radiation characterized by Talbot interferometryT. Salditt, S. Kalbfleisch, M. Osterhoff, S. P. Krüger, M. Bartels, K. Giewekemeyer, H. Neubauer, and M. Sprung »View Author Affiliations
T. Salditt,1
S. Kalbfleisch,1
M. Osterhoff,1
S. P. Krüger,1
M. Bartels,1
K. Giewekemeyer,1
H. Neubauer,1
and M. Sprung1,2,*
1Institut für Röntgenphysik, Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany 2HASYLAB at DESY, Notkestr. 85, 22607 Hamburg, Germany *Corresponding author: tsaldit@gwdg.de |
Optics Express, Vol. 19, Issue 10, pp. 9656-9675 (2011)
http://dx.doi.org/10.1364/OE.19.009656
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Abstract
We have studied the spatial coherence properties of a nano-focused x-ray beam by grating (Talbot) interferometry in projection geometry. The beam is focused by a fixed curvature mirror system optimized for high flux density under conditions of partial coherence. The spatial coherence of the divergent exit wave emitted from the mirror focus is measured by Talbot interferometry The results are compared to numerical calculations of coherence propagation. In view of imaging applications, the magnified in-line image of a test pattern formed under conditions of partial coherence is analyzed quantitatively. Finally, additional coherence filtering by use of x-ray waveguides is demonstrated. By insertion of x-ray waveguides, the beam diameter can be reduced from typical values of 200 nm to values below 15 nm. In proportion to the reduction in the focal spot size, the numerical aperture (NA) of the projection imaging system is increased, as well as the coherence length, as quantified by grating interferometry.
© 2011 OSA
OCIS Codes
(070.6760) Fourier optics and signal processing : Talbot and self-imaging effects
(340.7440) X-ray optics : X-ray imaging
(340.7450) X-ray optics : X-ray interferometry
ToC Category:
X-ray Optics
History
Original Manuscript: March 9, 2011
Revised Manuscript: April 24, 2011
Manuscript Accepted: April 25, 2011
Published: May 3, 2011
Citation
T. Salditt, S. Kalbfleisch, M. Osterhoff, S. P. Krüger, M. Bartels, K. Giewekemeyer, H. Neubauer, and M. Sprung, "Partially coherent nano-focused x-ray radiation characterized by Talbot interferometry," Opt. Express 19, 9656-9675 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-10-9656
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References
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- T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and E. Ziegler, “X-ray phase imaging with a grating interferometer,” Opt. Express 13, 6296–6304 (2005). [CrossRef] [PubMed]
- J.-P. Guigay, S. Zabler, P. Cloetens, C. David, R. Mokso, and M. Schlenker, “The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays,” J. Synch. Radiat. 11, 476–482 (2004). [CrossRef]
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- A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synch. Radiat. 17, 299–307 (2010). [CrossRef]
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- T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and E. Ziegler, “X-ray phase imaging with a grating interferometer,” Opt. Express 13, 6296–6304 (2005). [CrossRef] [PubMed]
- C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010). [CrossRef] [PubMed]
- P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008). [CrossRef] [PubMed]
- J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98, 034801– (2007). [CrossRef] [PubMed]
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- M. Guizar-Sicairos and J. R. Fienup, “Phase retrieval with transverse translation diversity: a nonlinearoptimization approach,” Opt. Express 16, 7264–7278 (2008). [CrossRef] [PubMed]
- J. R. Fienup, “Reconstruction of an object from the modulus of its fourier transform,” Opt. Lett. 3, 27–29 (1978). [CrossRef] [PubMed]
- L. D. Caro, C. Giannini, S. D. Fonzo, W. Yark, A. Cedola, and S. Lagomarsino, “Spatial coherence of x-ray planar waveguide exiting radiation,” Opt. Commun. 217, 31–45 (2003). [CrossRef]
- T. Salditt, S. P. Krger, C. Fuhse, and C. Bhtz, “High-transmission planar x-ray waveguides,” Phys. Rev. Lett. 100, 184801–4 (2008). [CrossRef] [PubMed]
- C. Fuhse, C. Ollinger, and T. Salditt, “Waveguide-based off-axis holography with hard x rays,” Phys. Rev. Lett. 97, 254801 (2006). [CrossRef]
- C. Fuhse and T. Salditt, “Finite-difference field calculations for two-dimensionally confined x-ray waveguides,” Appl. Opt. 45, 4603–4608 (2006). [CrossRef] [PubMed]
- L. D. Caro, C. Giannini, D. Pelliccia, C. Mocuta, T. H. Metzger, A. Guagliardi, A. Cedola, I. Burkeeva, and S. Lagomarsino, “In-line holography and coherent diffractive imaging with x-ray waveguides,” Phys. Rev. B 77, 081408 (2008). [CrossRef]
- L. D. Caro, C. Giannini, S. D. Fonzo, W. Yark, A. Cedola, and S. Lagomarsino, “Spatial coherence of x-ray planar waveguide exiting radiation,” Opt. Commun. 217, 31–45 (2003). [CrossRef]
- S. P. Krger, K. Giewekemeyer, S. Kalbfleisch, M. Bartels, H. Neubauer, and T. Salditt, “Sub-15 nm beam confinement by twocrossed x-ray waveguides,” Opt. Express 18, 13492–13501 (2010). [CrossRef]
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- S. Kalbfleisch, M. Osterhoff, K. Giewekemeyer, H. Neubauer, S. P. Krger, B. Hartmann, M. Bartels, M. Sprung, O. Leupold, F. Siewert, and T. Salditt, “The holography endstation of beamline P10 at PETRA III,” SRI 2009, AIP Conf. Proc. 1234, 433–436 (2010). [CrossRef]
- K. Giewekemeyer, H. Neubauer, S. Kalbfleisch, S. P. Krger, and T. Salditt, “Holographic and diffractive x-ray imaging using waveguides as quasi-point sources,” N. J. Phys. 12, 035008 (2010). [CrossRef]
- L. D. Caro, C. Giannini, D. Pelliccia, C. Mocuta, T. H. Metzger, A. Guagliardi, A. Cedola, I. Burkeeva, and S. Lagomarsino, “In-line holography and coherent diffractive imaging with x-ray waveguides,” Phys. Rev. B 77, 081408 (2008). [CrossRef]
- J.-P. Guigay, S. Zabler, P. Cloetens, C. David, R. Mokso, and M. Schlenker, “The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays,” J. Synch. Radiat. 11, 476–482 (2004). [CrossRef]
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- S. Kalbfleisch, M. Osterhoff, K. Giewekemeyer, H. Neubauer, S. P. Krger, B. Hartmann, M. Bartels, M. Sprung, O. Leupold, F. Siewert, and T. Salditt, “The holography endstation of beamline P10 at PETRA III,” SRI 2009, AIP Conf. Proc. 1234, 433–436 (2010). [CrossRef]
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- I. A. Vartanyants and A. Singer, “Coherence properties of hard x-ray synchrotron sources and x-ray free-electron lasers,” N. J. Phys. 12, 035004 (2010). [CrossRef]
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010). [CrossRef] [PubMed]
- Y. V. Kopylov, A. V. Popov, and A. V. Vinogradov, “Application of the parabolic wave equation to x-ray diffraction optics,” Opt. Commun. 118, 619–636 (1995). [CrossRef]
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synch. Radiat. 17, 299–307 (2010). [CrossRef]
- F. Pfeiffer, O. Bunk, C. Schulze-Briese, A. Diaz, T. Weitkamp, C. David, J. F. van der Veen, I. Vartanyants, and I. K. Robinson, “Shearing interferometer for quantifying the coherence of hard x-ray beams,” Phys. Rev. Lett. 94, 164801 (2005). [CrossRef] [PubMed]
- T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and E. Ziegler, “X-ray phase imaging with a grating interferometer,” Opt. Express 13, 6296–6304 (2005). [CrossRef] [PubMed]
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008). [CrossRef]
- G. J. Williams, H. M. Quiney, A. G. Peele, and K. A. Nugent, “Coherent diffractive imaging and partial coherence,” Phys. Rev. B 75, 104102 (2007). [CrossRef]
- E. Wolf, Introduction to the Theory of Coherence and Polarization of Light (Oxford University Press, 2007).
- H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, “Efficient focusing of hard x-rays to 25 nm by a total reflection mirror,” Appl. Phys. Lett. 90, 051903 (2007). [CrossRef]
- H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, “Efficient focusing of hard x-rays to 25 nm by a total reflection mirror,” Appl. Phys. Lett. 90, 051903 (2007). [CrossRef]
- H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, “Efficient focusing of hard x-rays to 25 nm by a total reflection mirror,” Appl. Phys. Lett. 90, 051903 (2007). [CrossRef]
- L. D. Caro, C. Giannini, S. D. Fonzo, W. Yark, A. Cedola, and S. Lagomarsino, “Spatial coherence of x-ray planar waveguide exiting radiation,” Opt. Commun. 217, 31–45 (2003). [CrossRef]
- H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, “Efficient focusing of hard x-rays to 25 nm by a total reflection mirror,” Appl. Phys. Lett. 90, 051903 (2007). [CrossRef]
- J.-P. Guigay, S. Zabler, P. Cloetens, C. David, R. Mokso, and M. Schlenker, “The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays,” J. Synch. Radiat. 11, 476–482 (2004). [CrossRef]
Adv. Phys.
- K. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 8732 (2010). [CrossRef]
Appl. Opt.
- C. Fuhse and T. Salditt, “Finite-difference field calculations for two-dimensionally confined x-ray waveguides,” Appl. Opt. 45, 4603–4608 (2006). [CrossRef] [PubMed]
Appl. Phys. Lett.
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, “Efficient focusing of hard x-rays to 25 nm by a total reflection mirror,” Appl. Phys. Lett. 90, 051903 (2007). [CrossRef]
J. Synch. Radiat.
- J.-P. Guigay, S. Zabler, P. Cloetens, C. David, R. Mokso, and M. Schlenker, “The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays,” J. Synch. Radiat. 11, 476–482 (2004). [CrossRef]
- A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synch. Radiat. 17, 299–307 (2010). [CrossRef]
N. J. Phys.
- K. Giewekemeyer, H. Neubauer, S. Kalbfleisch, S. P. Krger, and T. Salditt, “Holographic and diffractive x-ray imaging using waveguides as quasi-point sources,” N. J. Phys. 12, 035008 (2010). [CrossRef]
- I. A. Vartanyants and A. Singer, “Coherence properties of hard x-ray synchrotron sources and x-ray free-electron lasers,” N. J. Phys. 12, 035004 (2010). [CrossRef]
Nat. Phys.
- H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006). [CrossRef]
- B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008). [CrossRef]
Nature
- J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999). [CrossRef]
Opt. Commun.
- L. D. Caro, C. Giannini, S. D. Fonzo, W. Yark, A. Cedola, and S. Lagomarsino, “Spatial coherence of x-ray planar waveguide exiting radiation,” Opt. Commun. 217, 31–45 (2003). [CrossRef]
- Y. V. Kopylov, A. V. Popov, and A. V. Vinogradov, “Application of the parabolic wave equation to x-ray diffraction optics,” Opt. Commun. 118, 619–636 (1995). [CrossRef]
Opt. Express
- S. P. Krger, K. Giewekemeyer, S. Kalbfleisch, M. Bartels, H. Neubauer, and T. Salditt, “Sub-15 nm beam confinement by twocrossed x-ray waveguides,” Opt. Express 18, 13492–13501 (2010). [CrossRef]
- S. Mayo, T. Davis, T. Gureyev, P. Miller, D. Paganin, A. Pogany, A. Stevenson, and S. Wilkins, “X-ray phase-contrast microscopy and microtomography,” Opt. Express 11, 2289–2302 (2003). [CrossRef] [PubMed]
- T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and E. Ziegler, “X-ray phase imaging with a grating interferometer,” Opt. Express 13, 6296–6304 (2005). [CrossRef] [PubMed]
- M. Guizar-Sicairos and J. R. Fienup, “Phase retrieval with transverse translation diversity: a nonlinearoptimization approach,” Opt. Express 16, 7264–7278 (2008). [CrossRef] [PubMed]
Opt. Lett.
- J. R. Fienup, “Reconstruction of an object from the modulus of its fourier transform,” Opt. Lett. 3, 27–29 (1978). [CrossRef] [PubMed]
Phys. Rev. B
- G. J. Williams, H. M. Quiney, A. G. Peele, and K. A. Nugent, “Coherent diffractive imaging and partial coherence,” Phys. Rev. B 75, 104102 (2007). [CrossRef]
- L. D. Caro, C. Giannini, D. Pelliccia, C. Mocuta, T. H. Metzger, A. Guagliardi, A. Cedola, I. Burkeeva, and S. Lagomarsino, “In-line holography and coherent diffractive imaging with x-ray waveguides,” Phys. Rev. B 77, 081408 (2008). [CrossRef]
Phys. Rev. Lett.
- T. Salditt, S. P. Krger, C. Fuhse, and C. Bhtz, “High-transmission planar x-ray waveguides,” Phys. Rev. Lett. 100, 184801–4 (2008). [CrossRef] [PubMed]
- C. Fuhse, C. Ollinger, and T. Salditt, “Waveguide-based off-axis holography with hard x rays,” Phys. Rev. Lett. 97, 254801 (2006). [CrossRef]
- I. Bukreeva, A. Popov, D. Pelliccia, A. Cedola, S. B. Dabagov, and S. Lagomarsino, “Wave-field formation in a hollow x-ray waveguide,” Phys. Rev. Lett. 97, 184801 (2006).
- F. Pfeiffer, O. Bunk, C. Schulze-Briese, A. Diaz, T. Weitkamp, C. David, J. F. van der Veen, I. Vartanyants, and I. K. Robinson, “Shearing interferometer for quantifying the coherence of hard x-ray beams,” Phys. Rev. Lett. 94, 164801 (2005). [CrossRef] [PubMed]
- J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98, 034801– (2007). [CrossRef] [PubMed]
Rev. Sci. Instrum.
- S. Marchesini, “Invited article: A unified evaluation of iterative projection algorithms for phase retrieval,” Rev. Sci. Instrum. 78, 011301 (2007). [CrossRef] [PubMed]
Science
- P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008). [CrossRef] [PubMed]
SRI 2009, AIP Conf. Proc.
- S. Kalbfleisch, M. Osterhoff, K. Giewekemeyer, H. Neubauer, S. P. Krger, B. Hartmann, M. Bartels, M. Sprung, O. Leupold, F. Siewert, and T. Salditt, “The holography endstation of beamline P10 at PETRA III,” SRI 2009, AIP Conf. Proc. 1234, 433–436 (2010). [CrossRef]
Ultramicroscopy
- C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010). [CrossRef] [PubMed]
Other
- E. Wolf, Introduction to the Theory of Coherence and Polarization of Light (Oxford University Press, 2007).
- T. Weitkamp, “Imaging and tomography with high resolution using coherent hard synchrotron radiation,” Ph.D. thesis, Universitt Hamburg (2002).
- D. M. Paganin, Coherent X-Ray Optics (Oxford University Press, 2006). [CrossRef]
2010, Nugent, Adv. Phys.
- K. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 8732 (2010). [CrossRef]
- I. A. Vartanyants and A. Singer, “Coherence properties of hard x-ray synchrotron sources and x-ray free-electron lasers,” N. J. Phys. 12, 035004 (2010). [CrossRef]
- A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synch. Radiat. 17, 299–307 (2010). [CrossRef]
- A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schrder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
- C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010). [CrossRef] [PubMed]
- S. Kalbfleisch, M. Osterhoff, K. Giewekemeyer, H. Neubauer, S. P. Krger, B. Hartmann, M. Bartels, M. Sprung, O. Leupold, F. Siewert, and T. Salditt, “The holography endstation of beamline P10 at PETRA III,” SRI 2009, AIP Conf. Proc. 1234, 433–436 (2010). [CrossRef]
- K. Giewekemeyer, H. Neubauer, S. Kalbfleisch, S. P. Krger, and T. Salditt, “Holographic and diffractive x-ray imaging using waveguides as quasi-point sources,” N. J. Phys. 12, 035008 (2010). [CrossRef]
- P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008). [CrossRef] [PubMed]
- L. D. Caro, C. Giannini, D. Pelliccia, C. Mocuta, T. H. Metzger, A. Guagliardi, A. Cedola, I. Burkeeva, and S. Lagomarsino, “In-line holography and coherent diffractive imaging with x-ray waveguides,” Phys. Rev. B 77, 081408 (2008). [CrossRef]
- T. Salditt, S. P. Krger, C. Fuhse, and C. Bhtz, “High-transmission planar x-ray waveguides,” Phys. Rev. Lett. 100, 184801–4 (2008). [CrossRef] [PubMed]
- B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008). [CrossRef]
- G. J. Williams, H. M. Quiney, A. G. Peele, and K. A. Nugent, “Coherent diffractive imaging and partial coherence,” Phys. Rev. B 75, 104102 (2007). [CrossRef]
- H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, “Efficient focusing of hard x-rays to 25 nm by a total reflection mirror,” Appl. Phys. Lett. 90, 051903 (2007). [CrossRef]
- S. Marchesini, “Invited article: A unified evaluation of iterative projection algorithms for phase retrieval,” Rev. Sci. Instrum. 78, 011301 (2007). [CrossRef] [PubMed]
- J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98, 034801– (2007). [CrossRef] [PubMed]
- H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006). [CrossRef]
- C. Fuhse, C. Ollinger, and T. Salditt, “Waveguide-based off-axis holography with hard x rays,” Phys. Rev. Lett. 97, 254801 (2006). [CrossRef]
- F. Pfeiffer, O. Bunk, C. Schulze-Briese, A. Diaz, T. Weitkamp, C. David, J. F. van der Veen, I. Vartanyants, and I. K. Robinson, “Shearing interferometer for quantifying the coherence of hard x-ray beams,” Phys. Rev. Lett. 94, 164801 (2005). [CrossRef] [PubMed]
- J.-P. Guigay, S. Zabler, P. Cloetens, C. David, R. Mokso, and M. Schlenker, “The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays,” J. Synch. Radiat. 11, 476–482 (2004). [CrossRef]
- L. D. Caro, C. Giannini, S. D. Fonzo, W. Yark, A. Cedola, and S. Lagomarsino, “Spatial coherence of x-ray planar waveguide exiting radiation,” Opt. Commun. 217, 31–45 (2003). [CrossRef]
- J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999). [CrossRef]
- Y. V. Kopylov, A. V. Popov, and A. V. Vinogradov, “Application of the parabolic wave equation to x-ray diffraction optics,” Opt. Commun. 118, 619–636 (1995). [CrossRef]
- I. Bukreeva, A. Popov, D. Pelliccia, A. Cedola, S. B. Dabagov, and S. Lagomarsino, “Wave-field formation in a hollow x-ray waveguide,” Phys. Rev. Lett. 97, 184801 (2006).
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