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Energy Express

  • Editor: Bernard Kippelen
  • Vol. 19, Iss. S2 — Mar. 14, 2011
  • pp: A108–A117

Antireflective property of thin film a-Si solar cell structures with graded refractive index structure

Sung Jun Jang, Young Min Song, Chan Il Yeo, Chang Young Park, Jae Su Yu, and Yong Tak Lee  »View Author Affiliations

Optics Express, Vol. 19, Issue S2, pp. A108-A117 (2011)

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We report the antireflective property of thin film amorphous silicon (a-Si) solar cell structures based on graded refractive index structure together with theoretical analysis. Optimizations of the index profile are performed using the rigorous coupled-wave analysis method. The graded refractive index structure fabricated by oblique angle deposition suppresses optical reflection over a wide range of wavelength and incident angle, compared to the conventional structure. The average reflectance of thin film a-Si solar cell structure with the graded refractive index structure is suppressed by 54% at normal incidence due to the effective refractive index matching between ITO and a-Si, indicating a reasonable agreement with calculated results.

© 2010 OSA

OCIS Codes
(040.5350) Detectors : Photovoltaic
(160.4760) Materials : Optical properties
(310.1210) Thin films : Antireflection coatings
(310.1860) Thin films : Deposition and fabrication
(310.4165) Thin films : Multilayer design

ToC Category:

Original Manuscript: November 3, 2010
Revised Manuscript: December 16, 2010
Manuscript Accepted: December 27, 2010
Published: January 13, 2010

Sung Jun Jang, Young Min Song, Chan Il Yeo, Chang Young Park, Jae Su Yu, and Yong Tak Lee, "Antireflective property of thin film a-Si solar cell structures with graded refractive index structure," Opt. Express 19, A108-A117 (2011)

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