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Design and fabrication of vertical-injection GaN-based light-emitting diodes

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Abstract

The fabrication process and design issues for the fabrication of vertical-injection GaN-based light-emitting diodes were investigated. The process yield was reduced according to the adhesion of reflective p-electrodes, the exposure of electroplated metal in plasma, and wet-etching induced surface textures. The chip design utilizing current blocking layer and branched n-electrode was found to significantly affect the power efficiency of LEDs.

©2011 Optical Society of America

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Figures (5)

Fig. 1
Fig. 1 Ag-based electrode and its influence on LLO process. (a) Transmission electron microscopy (TEM) z-contrast image of AgCu p-electrodes. (b) The optical microscopic images of LEDs fabricated with Ag after LLO process.
Fig. 2
Fig. 2 Dry etching of N-polar GaN. (a) The dry etching rate of Ga-polar and N-polar GaN as a function of %Cl2. (b) SEM images of N-polar surfaces degraded after dry etching.
Fig. 3
Fig. 3 Wet etching of N-polar surface and its influence on light extraction. (a) The light extraction efficiency of vertical LEDs as a function of cone density. The upper and lower inset shows the SEM images of KOH-etched N-polar GaN and the schematic used for ray-tracing simulation, respectively. (b) TEM images of vertical chips (mesa sidewall) after KOH wet etching.
Fig. 4
Fig. 4 The LED performance before and after wet etching. (a) The EL spectra, (b) the optical output power, and (c) the forward voltages of vertical LEDs before and after wet etching.
Fig. 5
Fig. 5 The chip design of vertical LEDs using CBL and branched n-electrodes. (a) The schematic cross-sectional view of LEDs having CBL. (b) The schematic top-views of LED A-E (c) The forward voltage, (d) optical output power, and (e) the power efficiency of LED A-E.
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