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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 11 — May. 23, 2011
  • pp: 10647–10655

Real-time terahertz material characterization by numerical three-dimensional optimization

Maik Scheller  »View Author Affiliations


Optics Express, Vol. 19, Issue 11, pp. 10647-10655 (2011)
http://dx.doi.org/10.1364/OE.19.010647


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Abstract

Terahertz time domain spectroscopy allows for characterization of dielectrics even in cases where the samples thickness is unknown. However, a parameter extraction over a broad frequency range with simultaneous thickness determination is time consuming using conventional algorithms due to the large number of optimization steps. In this paper we present a novel method to extract the data. By employing a three dimensional optimization algorithm the calculation effort is significantly reduced while preserving the same accuracy level as conventional approaches. The presented method is even fast enough to be used in imaging applications.

© 2011 OSA

OCIS Codes
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Spectroscopy

History
Original Manuscript: March 8, 2011
Revised Manuscript: May 5, 2011
Manuscript Accepted: May 6, 2011
Published: May 16, 2011

Citation
Maik Scheller, "Real-time terahertz material characterization by numerical three-dimensional optimization," Opt. Express 19, 10647-10655 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-11-10647


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References

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