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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 12 — Jun. 6, 2011
  • pp: 11539–11544

Quantitative analysis and measurements of near-field interactions in terahertz microscopes

Kiwon Moon, Euna Jung, Meehyun Lim, Youngwoong Do, and Haewook Han  »View Author Affiliations

Optics Express, Vol. 19, Issue 12, pp. 11539-11544 (2011)

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We demonstrated quantitative analysis and measurements of near-fields interactions in a terahertz pulse near-field microscope. We developed a self-consistent line dipole image method for the quantitative analysis of the near-field interaction in THz scattering-type scanning optical microscopes. The measurements of approach curves and relative contrasts on gold and silicon substrates were in excellent agreement with calculations.

© 2011 OSA

OCIS Codes
(180.4243) Microscopy : Near-field microscopy
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:

Original Manuscript: March 28, 2011
Revised Manuscript: May 17, 2011
Manuscript Accepted: May 27, 2011
Published: May 31, 2011

Virtual Issues
Vol. 6, Iss. 7 Virtual Journal for Biomedical Optics

Kiwon Moon, Euna Jung, Meehyun Lim, Youngwoong Do, and Haewook Han, "Quantitative analysis and measurements of near-field interactions in terahertz microscopes," Opt. Express 19, 11539-11544 (2011)

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