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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 12 — Jun. 6, 2011
  • pp: 11680–11690

Evolution of Photo-induced defects in Ge-doped fiber/preform: influence of the drawing

A. Alessi, S. Girard, M. Cannas, S. Agnello, A. Boukenter, and Y. Ouerdane  »View Author Affiliations

Optics Express, Vol. 19, Issue 12, pp. 11680-11690 (2011)

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We have studied the generation mechanisms of two different radiation-induced point defects, the Ge(1) and Ge(2) centers, in a germanosilicate fiber and in its original preform. The samples have been investigated before and after X-ray irradiation using the confocal microscopy luminescence and the electron paramagnetic resonance techniques. Our experimental results show the higher radiation sensitivity of the fiber as compared to the perform and suggest a relation between Ge(1) and Ge(2) generation. To explain our data we have used different models, finding that the destruction probability of the Ge(1) and Ge(2) defects is larger in fiber than in preform, whereas the generation one is similar. Finally we found that the higher radiation sensitivity of the fiber at low doses is essentially related to the presence of germanium lone pair center generated by the drawing.

© 2011 OSA

OCIS Codes
(060.2310) Fiber optics and optical communications : Fiber optics
(160.2220) Materials : Defect-center materials
(300.2140) Spectroscopy : Emission
(300.6370) Spectroscopy : Spectroscopy, microwave
(350.5610) Other areas of optics : Radiation

ToC Category:
Fiber Optics and Optical Communications

Original Manuscript: February 3, 2011
Revised Manuscript: March 13, 2011
Manuscript Accepted: March 15, 2011
Published: June 1, 2011

A. Alessi, S. Girard, M. Cannas, S. Agnello, A. Boukenter, and Y. Ouerdane, "Evolution of Photo-induced defects in Ge-doped fiber/preform: influence of the drawing," Opt. Express 19, 11680-11690 (2011)

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