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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 13 — Jun. 20, 2011
  • pp: 12700–12718

Measurements of 3D relative locations of particles by Fourier Interferometry Imaging (FII)

Paul Briard, Sawitree Saengkaew, Xuecheng Wu, Siegfried Meunier-Guttin-Cluzel, Linghong Chen, Kefa Cen, and Gérard Grehan  »View Author Affiliations


Optics Express, Vol. 19, Issue 13, pp. 12700-12718 (2011)
http://dx.doi.org/10.1364/OE.19.012700


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Abstract

In a large number of physical systems formed of discrete particles, a key parameter is the relative distance between the objects, as for example in studies of spray evaporation or droplets micro-explosion. This paper is devoted to the presentation of an approach where the relative 3D location of particles in the control volume is accurately extracted from the interference patterns recorded at two different angles. No reference beam is used and only ten (2 + 8) 2D-FFT have to be computed.

© 2011 OSA

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(290.4020) Scattering : Mie theory

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 25, 2011
Revised Manuscript: May 31, 2011
Manuscript Accepted: June 1, 2011
Published: June 16, 2011

Citation
Paul Briard, Sawitree Saengkaew, Xuecheng Wu, Siegfried Meunier-Guttin-Cluzel, Linghong Chen, Kefa Cen, and Gérard Grehan, "Measurements of 3D relative locations of particles by Fourier Interferometry Imaging (FII)," Opt. Express 19, 12700-12718 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-13-12700


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References

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