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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 14 — Jul. 4, 2011
  • pp: 13073–13080

Color filters including infrared cut-off integrated on CMOS image sensor

Laurent Frey, Pascale Parrein, Jacques Raby, Catherine Pellé, Didier Hérault, Michel Marty, and Jean Michailos  »View Author Affiliations

Optics Express, Vol. 19, Issue 14, pp. 13073-13080 (2011)

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A color image was taken with a CMOS image sensor without any infrared cut-off filter, using red, green and blue metal/dielectric filters arranged in Bayer pattern with 1.75µm pixel pitch. The three colors were obtained by a thickness variation of only two layers in the 7-layer stack, with a technological process including four photolithography levels. The thickness of the filter stack was only half of the traditional color resists, potentially enabling a reduction of optical crosstalk for smaller pixels. Both color errors and signal to noise ratio derived from optimized spectral responses are expected to be similar to color resists associated with infrared filter.

© 2011 OSA

OCIS Codes
(040.1490) Detectors : Cameras
(310.0310) Thin films : Thin films
(330.1710) Vision, color, and visual optics : Color, measurement
(130.7408) Integrated optics : Wavelength filtering devices

ToC Category:

Original Manuscript: February 4, 2011
Revised Manuscript: April 8, 2011
Manuscript Accepted: April 8, 2011
Published: June 22, 2011

Virtual Issues
Vol. 6, Iss. 8 Virtual Journal for Biomedical Optics

Laurent Frey, Pascale Parrein, Jacques Raby, Catherine Pellé, Didier Hérault, Michel Marty, and Jean Michailos, "Color filters including infrared cut-off integrated on CMOS image sensor," Opt. Express 19, 13073-13080 (2011)

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