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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 14 — Jul. 4, 2011
  • pp: 13664–13674

Optical characterization of a SCISSOR device

Mattia Mancinelli, Romain Guider, Marco Masi, Paolo Bettotti, Manga Rao Vanacharla, Jean-Marc Fedeli, and Lorenzo Pavesi  »View Author Affiliations

Optics Express, Vol. 19, Issue 14, pp. 13664-13674 (2011)

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Here, we report on the design, fabrication and characterization of single-channel (SC-) and dual-channel (DC-) side-coupled integrated spaced sequences of optical resonators (SCISSOR) with a finite number (eight) of microring resonators using submicron silicon photonic wires on a silicon-on-insulator (SOI) wafer. We present results on the observation of multiple resonances in the through and the drop port signals of DC-SCISSOR. These result from the coupled resonator induced transparency (CRIT) which appears when the resonator band (RB) and the Bragg band (BB) are nearly coincident. We also observe the formation of high-Q (> 23000) quasi-localized modes in the RB of the drop transmission which appear when the RB and BB are well separated from each other. These multiple resonances and quasi-localized modes are induced by nanometer-scale structural disorders in the dimension of one or more rings. Finally, we demonstrate the tunability of RB (and BB) and localized modes in the DC-SCISSOR by thermo-optical or free-carrier refraction.

© 2011 OSA

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(230.5750) Optical devices : Resonators
(250.5300) Optoelectronics : Photonic integrated circuits
(230.4555) Optical devices : Coupled resonators

ToC Category:
Integrated Optics

Original Manuscript: April 7, 2011
Revised Manuscript: June 8, 2011
Manuscript Accepted: June 14, 2011
Published: June 30, 2011

Mattia Mancinelli, Romain Guider, Marco Masi, Paolo Bettotti, Manga Rao Vanacharla, Jean-Marc Fedeli, and Lorenzo Pavesi, "Optical characterization of a SCISSOR device," Opt. Express 19, 13664-13674 (2011)

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