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Self-quenching InGaAs/InP single photon avalanche detector utilizing zinc diffusion rings |
Optics Express, Vol. 19, Issue 16, pp. 15149-15154 (2011)
http://dx.doi.org/10.1364/OE.19.015149
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Abstract
InGaAs single photon avalanche detectors have previously been fabricated with a negative-feedback mechanism, which allows for free-running Geiger-mode operation and improves the signal noise. To reduce the dark count and improve the detection efficiency, zinc diffusion is necessary to define the p-i-n junction and separate the high-field region from any mesa surface. Here, we demonstrate the benefits of a simple Zn-diffused geometry, yielding 1550nm single-photon detection efficiencies of 20% with a dark count rate of 8 kHz at 140 K for a 22μm diameter device.
© 2011 OSA
OCIS Codes
(040.3060) Detectors : Infrared
(250.1345) Optoelectronics : Avalanche photodiodes (APDs)
(250.0040) Optoelectronics : Detectors
ToC Category:
Detectors
History
Original Manuscript: May 19, 2011
Manuscript Accepted: June 27, 2011
Published: July 21, 2011
Citation
James Cheng, Sifang You, Samia Rahman, and Yu-Hwa Lo, "Self-quenching InGaAs/InP single photon avalanche detector utilizing zinc diffusion rings," Opt. Express 19, 15149-15154 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-16-15149
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References
- G. Ribordy, N. Gisin, O. Guinnard, D. Stucki, M. Wegmuller, and H. Zbinden, “Photon counting at telecom wavelengths with commercial InGaAs/InP avalanche photodiodes,” J. Mod. Opt. 51, 1381 (2004).
- A. Trifonov, D. Subacius, A. Berzanskis, and A. Zavriyev, “Single photon counting at telecom wavelength and quantum key distribution,” J. Mod. Opt. 51, 1399 (2004).
- K. Zhao, A. Zhang, Y.-H. Lo, and W. Farr, “InGaAs single photon avalanche detector with ultralow excess noise,” Appl. Phys. Lett. 91(8), 081107 (2007). [CrossRef]
- K. Zhao, S. You, J. Cheng, and Y.-H. Lo, “Self-quenching and self-recovering InGaAs/InAlAs single photon avalanche detector,” Appl. Phys. Lett. 93(15), 153504 (2008). [CrossRef]
- J. Cheng, S. You, K. Zhao, and Y.-H. Lo, “Self-quenched InGaAs single-photon detector,” Proc. SPIE 7320(732010), 732010, 732010-9 (2009). [CrossRef]
- H. Sudo and M. Suzuki, “Surface degradation mechanism of InP/InGaAs APDs,” J. Lightwave Technol. 6(10), 1496–1501 (1988). [CrossRef]
- Y. Liu, S. R. Forrest, J. Hladky, M. J. Lange, G. H. Olsen, and D. E. Ackley, “A planar InP/InGaAs avalanche photodiode with floating guard ring and double diffused junction,” J. Lightwave Technol. 10(2), 182–193 (1992). [CrossRef]
- G. Hasnain, W. G. Bi, S. Song, J. T. Anderson, N. Moll, C.-Y. Su, J. N. Hollenhorst, N. D. Baynes, I. Athroll, S. Amos, and R. M. Ash, “Buried-mesa avalanche photodiodes,” IEEE J. Quantum Electron. 34(12), 2321–2326 (1998). [CrossRef]
- M. D. Kim, J. M. Baek, T. G. Kim, S. G. Kim, and K. S. Chung, “Characterization of double floating guard ring type InP-InGaAs avalanche photodiodes with Au/Zn low resistance ohmic contacts,” Thin Solid Films 514(1–2), 250–253 (2006). [CrossRef]
- S. R. Cho, S. K. Yang, J. S. Ma, S. D. Lee, J. S. Yu, A. G. Choo, T. I. Kim, and J. Burm, “Suppression of avalanche multiplication at the periphery of diffused junction by floating guard rings in a planar InGaAs-InP avalanche photodiode,” IEEE Photon. Technol. Lett. 12(5), 534–536 (2000). [CrossRef]
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