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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 16 — Aug. 1, 2011
  • pp: 15516–15524

Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam

J. Gaudin, B. Keitel, A. Jurgilaitis, R. Nüske, L. Guérin, J. Larsson, K. Mann, B. Schäfer, K. Tiedtke, A. Trapp, Th. Tschentscher, F. Yang, M. Wulff, H. Sinn, and B. Flöter  »View Author Affiliations

Optics Express, Vol. 19, Issue 16, pp. 15516-15524 (2011)

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We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials.

© 2011 OSA

OCIS Codes
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(160.4670) Materials : Optical materials
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

Original Manuscript: May 26, 2011
Revised Manuscript: July 6, 2011
Manuscript Accepted: July 6, 2011
Published: July 28, 2011

J. Gaudin, B. Keitel, A. Jurgilaitis, R. Nüske, L. Guérin, J. Larsson, K. Mann, B. Schäfer, K. Tiedtke, A. Trapp, Th. Tschentscher, F. Yang, M. Wulff, H. Sinn, and B. Flöter, "Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam," Opt. Express 19, 15516-15524 (2011)

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