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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 16 — Aug. 1, 2011
  • pp: 15516–15524

Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam

J. Gaudin, B. Keitel, A. Jurgilaitis, R. Nüske, L. Guérin, J. Larsson, K. Mann, B. Schäfer, K. Tiedtke, A. Trapp, Th. Tschentscher, F. Yang, M. Wulff, H. Sinn, and B. Flöter  »View Author Affiliations


Optics Express, Vol. 19, Issue 16, pp. 15516-15524 (2011)
http://dx.doi.org/10.1364/OE.19.015516


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Abstract

We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials.

© 2011 OSA

OCIS Codes
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(160.4670) Materials : Optical materials
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

History
Original Manuscript: May 26, 2011
Revised Manuscript: July 6, 2011
Manuscript Accepted: July 6, 2011
Published: July 28, 2011

Citation
J. Gaudin, B. Keitel, A. Jurgilaitis, R. Nüske, L. Guérin, J. Larsson, K. Mann, B. Schäfer, K. Tiedtke, A. Trapp, Th. Tschentscher, F. Yang, M. Wulff, H. Sinn, and B. Flöter, "Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam," Opt. Express 19, 15516-15524 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-16-15516


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References

  1. S. Qian, W. Jark, G. Sostero, A. Gambitta, F. Mazzolini, and A. Savoia, “Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler,” Appl. Opt. 36(16), 3769–3775 (1997). [CrossRef] [PubMed]
  2. J. Susini, R. Baker, M. Krumrey, W. Schwegle, and I. Kvick, “Adaptive x-ray mirror prototype: first results,” Rev. Sci. Instrum. 66(2), 2048–2052 (1995). [CrossRef]
  3. P. Revesz and A. Kazimirov, “In situ measurements of thermal distortions in synchrotron optics under high heat load,” Synchrotron Radiation News 23(1), 32–35 (2010). [CrossRef]
  4. W. Ackermann, G. Asova, V. Ayvazyan, A. Azima, N. Baboi, J. Bähr, V. Balandin, B. Beutner, A. Brandt, A. Bolzmann, R. Brinkmann, O. I. Brovko, M. Castellano, P. Castro, L. Catani, E. Chiadroni, S. Choroba, A. Cianchi, T. Costello, D. Cubaynes, J. Dardis, W. Decking, H. Delsim-Hashemi, A. Delserieys, G. Di Pirro, M. Dohlus, S. Düsterer, A. Eckhardt, T. Edwards, B. Faatz, J. Feldhaus, K. Flöttmann, J. Frisch, L. Fröhlich, T. Garvey, U. Gensch, Ch. Gerth, M. Görler, N. Golubeva, H.-J. Grabosch, M. Grecki, O. Grimm, K. Hacker, U. Hahn, J. H. Han, K. Honkavaara, T. Hott, M. Hüning, Y. Ivanisenko, E. Jaeschke, W. Jalmuzna, T. Jezynski, R. Kammering, V. Katalev, K. Kavanagh, E. T. Kennedy, S. Khodyachykh, K. Klose, V. Kocharyan, M. Körfer, M. Kollewe, W. Koprek, S. Korepanov, D. Kostin, M. Krassilnikov, G. Kube, M. Kuhlmann, C. L. S. Lewis, L. Lilje, T. Limberg, D. Lipka, F. Löhl, H. Luna, M. Luong, M. Martins, M. Meyer, P. Michelato, V. Miltchev, W. D. Möller, L. Monaco, W. F. O. Müller, O. Napieralski, O. Napoly, P. Nicolosi, D. Nölle, T. Nuñez, A. Oppelt, C. Pagani, R. Paparella, N. Pchalek, J. Pedregosa-Gutierrez, B. Petersen, B. Petrosyan, G. Petrosyan, L. Petrosyan, J. Pflüger, E. Plönjes, L. Poletto, K. Pozniak, E. Prat, D. Proch, P. Pucyk, P. Radcliffe, H. Redlin, K. Rehlich, M. Richter, M. Roehrs, J. Roensch, R. Romaniuk, M. Ross, J. Rossbach, V. Rybnikov, M. Sachwitz, E. L. Saldin, W. Sandner, H. Schlarb, B. Schmidt, M. Schmitz, P. Schmüser, R. Schneider, A. Schneidmiller, S. Schnepp, S. Schreiber, M. Seidel, D. Sertore, V. Shabunov, C. Simon, S. Simrock, E. Sombrowski, A. Sorokin, P. Spanknebel, R. Spesyvtsev, L. Staykov, B. Steffen, F. Stephan, F. Stulle, H. Thom, K. Tiedtke, M. Tischer, S. Toleikis, R. Treusch, D. Trines, I. Tsakov, E. Vogel, T. Weiland, H. Weise, M. Wellhöfer, M. Wendt, I. Will, A. Winter, K. Wittenburg, W. Wurth, P. Yeates, V. Yurkov, I. Zagorodnov, and K. Zapfe, “Operation of a free-electron laser from the extreme ultraviolet to the water window,” Nat. Photonics 1(6), 336–342 (2007). [CrossRef]
  5. P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F.-J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H.-D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010). [CrossRef]
  6. A. Barty, R. Soufli, T. McCarville, S. L. Baker, M. J. Pivovaroff, P. Stefan, and R. Bionta, “Predicting the coherent X-ray wavefront focal properties at the Linac Coherent Light Source (LCLS) X-ray free electron laser,” Opt. Express 17(18), 15508–15519 (2009). [CrossRef] [PubMed]
  7. G. Geloni, E. Saldin, L. Samoylova, E. Schneidmiller, H. Sinn, Th. Tschentscher, and M. Yurkov, “Coherence properties of the European XFEL,” N. J. Phys. 12(3), 035021 (2010). [CrossRef]
  8. F. Siewert, J. Buchheim, and T. Zeschke, “Characterization and calibration of 2nd generation slope measuring profiler,” Nucl. Instrum. Meth. Phys. Res. Sect. A 616(2-3), 119–127 (2010). [CrossRef]
  9. A. R. B. de Castro, A. R. Vasconcellos, and R. Luzzi, “Thermoelastic analysis of a silicon surface under x-ray free-electron-laser irradiation,” Rev. Sci. Instrum. 81(7), 073102 (2010). [CrossRef] [PubMed]
  10. A. R. B. de Castro, A. R. Vasconcellos, and R. Luzzi, “Erratum: ‘Thermoelastic analysis of a silicon surface under x-ray free-electron-laser irradiation’,” Rev. Sci. Instrum. 82(4), 049901 (2011). [CrossRef]
  11. B. Schäfer, J. Gloger, U. Leinhos, and K. Mann, “Photo-thermal measurement of absorptance losses, temperature induced wavefront deformation and compaction in DUV-optics,” Opt. Express 17(25), 23025–23036 (2009). [CrossRef] [PubMed]
  12. J. Hartmann, “Bemerkungen über den Bau und die Justirung von Spektrographen,” Z. Instrumentenkd 1900(20), 47 (1900).
  13. J. Hoszowska, J.-S. Migliore, V. Mocella, C. Ferrero, A. K. Freund, and L. Zhang, “Performance of synchrotron X-ray monochromators under heat load Part 1: finite element modeling,” Nucl. Instrum. Meth. Phys. Res. Sect. A 467-468, 409–413 (2001). [CrossRef]
  14. T. K. Kim, J. H. Lee, M. Wulff, Q. Kong, and H. Ihee, “Spatiotemporal kinetics in solution studied by time-resolved X-ray liquidography (solution scattering),” ChemPhysChem 10(12), 1958–1980 (2009). [CrossRef] [PubMed]
  15. M. Born and E. Wolf, Principles of Optics, 6th ed. (Cambridge University Press, Cambridge, 1985)
  16. D. R. Neal, W. J. Alford, J. K. Gruetzner, and M. E. Warren, “Amplitude and phase beam characterization using a two-dimensional wavefront sensor,” Proc. SPIE 2870, 72–82 (1996). [CrossRef]
  17. B. Schäfer and K. Mann, “Investigation of the propagation characteristics of excimer lasers using a Hartmann-Shack sensor,” Rev. Sci. Instrum. 71(7), 2663–2668 (2000). [CrossRef]
  18. J. J. Wortman and R. A. Evans, “Young's modulus, shear modulus, and Poisson's ratio in silicon and germanium,” J. Appl. Phys. 36(1), 153–156 (1965). [CrossRef]

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