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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 17 — Aug. 15, 2011
  • pp: 16008–16021

Effects of surface reflectance on skylight polarization measurements at the Mauna Loa Observatory

Andrew R. Dahlberg, Nathan J. Pust, and Joseph A. Shaw  »View Author Affiliations


Optics Express, Vol. 19, Issue 17, pp. 16008-16021 (2011)
http://dx.doi.org/10.1364/OE.19.016008


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Abstract

An all-sky imaging polarimeter was deployed in summer 2008 to the Mauna Loa Observatory in Hawaii to study clear-sky atmospheric skylight polarization. The imager operates in five wavebands in the visible and near infrared spectrum and has a fisheye lens for all-sky viewing. This paper describes the deployment and presents comparisons of the degree of skylight polarization observed to similar data observed by Coulson with a principal-plane scanning polarimeter in the late 1970s. In general, the results compared favorably to those of Coulson. In addition, we present quantitative results correlating a variation of the maximum degree of polarization over a range of 70-85% to fluctuation in underlying surface reflectance and upwelling radiance data from the GOES satellite.

© 2011 OSA

OCIS Codes
(010.1310) Atmospheric and oceanic optics : Atmospheric scattering
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization
(010.1615) Atmospheric and oceanic optics : Clouds
(110.5405) Imaging systems : Polarimetric imaging

ToC Category:
Atmospheric and Oceanic Optics

History
Original Manuscript: May 31, 2011
Revised Manuscript: July 18, 2011
Manuscript Accepted: August 2, 2011
Published: August 5, 2011

Citation
Andrew R. Dahlberg, Nathan J. Pust, and Joseph A. Shaw, "Effects of surface reflectance on skylight polarization measurements at the Mauna Loa Observatory," Opt. Express 19, 16008-16021 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-17-16008


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