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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 17 — Aug. 15, 2011
  • pp: 16324–16329

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

Susanne Hönig, Robert Hoppe, Jens Patommel, Andreas Schropp, Sandra Stephan, Sebastian Schöder, Manfred Burghammer, and Christian G. Schroer  »View Author Affiliations

Optics Express, Vol. 19, Issue 17, pp. 16324-16329 (2011)

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Scanning coherent diffraction microscopy (ptychography) is an emerging hard x-ray microscopy technique that yields spatial resolutions well below the lateral size of the probing nanobeam. Besides a high resolution image of the object, the complex wave field of the probe can be reconstructed at the position of the object. By verifying the consistency of several independent wave field measurements along the optical axis, we address the question of how well the reconstruction represents the nanobeam. With a single ptychogram the wave field can be properly determined over a large range along the optical axis, also at positions inaccessible otherwise.

© 2011 OSA

OCIS Codes
(100.5070) Image processing : Phase retrieval
(110.1650) Imaging systems : Coherence imaging
(340.7460) X-ray optics : X-ray microscopy

ToC Category:
X-ray Optics

Original Manuscript: April 4, 2011
Revised Manuscript: July 2, 2011
Manuscript Accepted: August 1, 2011
Published: August 10, 2011

Virtual Issues
Vol. 6, Iss. 9 Virtual Journal for Biomedical Optics

Susanne Hönig, Robert Hoppe, Jens Patommel, Andreas Schropp, Sandra Stephan, Sebastian Schöder, Manfred Burghammer, and Christian G. Schroer, "Full optical characterization of coherent x-ray nanobeams by ptychographic imaging," Opt. Express 19, 16324-16329 (2011)

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  1. C. Quitmann, C. David, F. Nolting, F. Pfeiffer, and M. Stampanoni, Proceedings of the 9th International Conference on X-ray Microscopy, Journal of Physics: Conference Series (IOP, Bristol, 2009), vol. 186.
  2. A. Schropp, P. Boye, A. Goldschmidt, S. Hönig, R. Hoppe, J. Patommel, C. Rakete, D. Samberg, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Non-destructive and quantitative imaging of a nano-structured microchip by ptychographic hard x-ray scanning microscopy,” J. Microsc. 241, 9–12 (2011). [CrossRef]
  3. M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–440 (2010). [CrossRef] [PubMed]
  4. J.-D. Grunwaldt and C. G. Schroer, “Hard and soft x-ray microscopy and tomography in catalysis: Bridging the different time and length scales,” Chem. Soc. Rev. 39, 4741 (2010). [CrossRef] [PubMed]
  5. P. Bleuet, E. Welcomme, E. Dooryhée, J. Susini, J.-L. Hodeau, and P. Walter, “Probing the structure of heterogeneous diluted materials by diffraction tomography,” Nat. Mater. 7, 468–472 (2008). [CrossRef] [PubMed]
  6. C. G. Schroer, M. Kuhlmann, S. V. Roth, R. Gehrke, N. Stribeck, A. Almendarez-Camarillo, and B. Lengeler, “Mapping the local nanostructure inside a specimen by tomographic small angle x-ray scattering,” Appl. Phys. Lett. 88, 164102 (2006). [CrossRef]
  7. A. Carmona, P. Cloetens, G. Deves, S. Bohic, and R. Ortega, “Nano-imaging of trace metals by synchrotron x-ray fluorescence into dopaminergic single cells and neurite-like processes,” J. Anal. At. Spectrom. 23, 1083–1088 (2008). [CrossRef]
  8. C. G. Schroer, M. Kuhlmann, T. F. Günzler, B. Lengeler, M. Richwin, B. Griesebock, D. Lützenkirchen-Hecht, R. Frahm, E. Ziegler, A. Mashayekhi, D. Haeffner, J.-D. Grunwaldt, and A. Baiker, “Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy,” Appl. Phys. Lett. 82, 3360–3362 (2003). [CrossRef]
  9. F. Pfeiffer, C. David, J. F. van der Veen, and C. Bergemann, “Nanometer focusing properties of Fesnel zone plates described by dynamical diffraction theory,” Phys. Rev. B 73, 245331 (2006). [CrossRef]
  10. C. G. Schroer, “Focusing hard x rays to nanometer dimensions using Fresnel zone plates,” Phys. Rev. B 74, 033405 (2006). [CrossRef]
  11. H. Yan, J. Maser, A. Macrander, Q. Shen, S. Vogt, G. B. Stephenson, and H. C. Kang, “Takagi-taupin description of x-ray dynamical diffraction from diffractive optics with large numerical aperture,” Phys. Rev. B 76, 115438 (2007). [CrossRef]
  12. C. G. Schroer, O. Kurapova, J. Patommel, P. Boye, J. Feldkamp, B. Lengeler, M. Burghammer, C. Riekel, L. Vincze, A. van der Hart, and M. Küchler, “Hard x-ray nanoprobe based on refractive x-ray lenses,” Appl. Phys. Lett. 87, 124103 (2005). [CrossRef]
  13. H. C. Kang, H. Yan, R. P. Winarski, M. V. Holt, J. Maser, C. Liu, R. Conley, S. Vogt, A. T. Macrander, and G. B. Stephenson, “Focusing of hard x-rays to 16 nanometers with a multilayer laue lens,” Appl. Phys. Lett. 92, 221114 (2008). [CrossRef]
  14. H. Mimura, S. Handa, T. Kimura, H. Yumoto, D. Yamakawa, H. Yokoyama, S. Matsuyama, K. Inagaki, K. Yamamura, Y. Sano, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, and K. Yamauchi, “Breaking the 10 nm barrier in hard-X-ray focusing,” Nat. Phys. 6, 122–125 (2010). [CrossRef]
  15. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008). [CrossRef] [PubMed]
  16. M. Guizar-Sicairos and J. R. Fienup, “Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity,” Opt. Express 17, 2670–2685 (2009). [CrossRef] [PubMed]
  17. A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009). [CrossRef] [PubMed]
  18. P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009). [CrossRef] [PubMed]
  19. A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schöder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett. 96, 091102 (2010). [CrossRef]
  20. C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics,” Ultramicroscopy 110, 325–329 (2010). [CrossRef] [PubMed]
  21. J. M. Rodenburg and H. M. L. Faulkner, “A phase retrieval algorithm for shifting illumination,” Appl. Phys. Lett. 85, 4795–4797 (2004). [CrossRef]
  22. C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard x-ray beam alignment of K-B mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010). [CrossRef] [PubMed]
  23. V. Kohn, I. Snigireva, and A. Snigirev, “Direct measurement of transverse coherence length of hard X rays from interference fringes,” Phys. Rev. Lett. 85, 2745–2748 (2000). [CrossRef] [PubMed]
  24. C. G. Schroer, P. Boye, J. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008). [CrossRef] [PubMed]
  25. K. Giewekemeyer, M. Beckers, T. Gorniak, M. Grunze, T. Salditt, and A. Rosenhahn, “Ptychographic coherent x-ray diffractive imaging in the water window,” Opt. Express 19, 1037–1050 (2011). [CrossRef] [PubMed]
  26. T. Salditt, S. P. Krueger, C. Fuhse, and C. Bahtz, “High-transmission planar x-ray waveguides,” Phys. Rev. Lett. 100, 184801 (2008).

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