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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 17 — Aug. 15, 2011
  • pp: 16324–16329

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

Susanne Hönig, Robert Hoppe, Jens Patommel, Andreas Schropp, Sandra Stephan, Sebastian Schöder, Manfred Burghammer, and Christian G. Schroer  »View Author Affiliations


Optics Express, Vol. 19, Issue 17, pp. 16324-16329 (2011)
http://dx.doi.org/10.1364/OE.19.016324


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Abstract

Scanning coherent diffraction microscopy (ptychography) is an emerging hard x-ray microscopy technique that yields spatial resolutions well below the lateral size of the probing nanobeam. Besides a high resolution image of the object, the complex wave field of the probe can be reconstructed at the position of the object. By verifying the consistency of several independent wave field measurements along the optical axis, we address the question of how well the reconstruction represents the nanobeam. With a single ptychogram the wave field can be properly determined over a large range along the optical axis, also at positions inaccessible otherwise.

© 2011 OSA

OCIS Codes
(100.5070) Image processing : Phase retrieval
(110.1650) Imaging systems : Coherence imaging
(340.7460) X-ray optics : X-ray microscopy

ToC Category:
X-ray Optics

History
Original Manuscript: April 4, 2011
Revised Manuscript: July 2, 2011
Manuscript Accepted: August 1, 2011
Published: August 10, 2011

Virtual Issues
Vol. 6, Iss. 9 Virtual Journal for Biomedical Optics

Citation
Susanne Hönig, Robert Hoppe, Jens Patommel, Andreas Schropp, Sandra Stephan, Sebastian Schöder, Manfred Burghammer, and Christian G. Schroer, "Full optical characterization of coherent x-ray nanobeams by ptychographic imaging," Opt. Express 19, 16324-16329 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-17-16324


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