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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 18 — Aug. 29, 2011
  • pp: 17173–17178

Spectral shearing interferometer with frequency- and time-resolved sum-frequency mixing

Hitoshi Tomita and Hajime Nishioka  »View Author Affiliations

Optics Express, Vol. 19, Issue 18, pp. 17173-17178 (2011)

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A two-dimensional spectral-shearing interferogram has been acquired instantaneously by frequency- and time-resolved sum-frequency conversion where the phase-matching angle and transverse-delay of crossed-pump beams in a nonlinear crystal serve as frequency-time decomposed imaging. The two spectrally sheared components travel the same path after upconversion. A picoseconds delay-scanned interferogram is accumulated on a 2D image sensor.

© 2011 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(320.5540) Ultrafast optics : Pulse shaping
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: July 1, 2011
Revised Manuscript: August 8, 2011
Manuscript Accepted: August 10, 2011
Published: August 17, 2011

Hitoshi Tomita and Hajime Nishioka, "Spectral shearing interferometer with frequency- and time-resolved sum-frequency mixing," Opt. Express 19, 17173-17178 (2011)

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