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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 18 — Aug. 29, 2011
  • pp: 17226–17231

Thickness determination of graphene on metal substrate by reflection spectroscopy

Tommi Kaplas, Aleksey Zolotukhin, and Yuri Svirko  »View Author Affiliations


Optics Express, Vol. 19, Issue 18, pp. 17226-17231 (2011)
http://dx.doi.org/10.1364/OE.19.017226


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Abstract

We show that reflectivity measurements enable the determination of the thickness of multilayered graphene on a metal substrate. The developed technique is based on comparison of the substrate reflectance with and without graphene and relies on the strong absorbance of graphene and high refractive index contrast. We demonstrate the technique by measuring the thickness of the CVD graphene film grown on a copper substrate.

© 2011 OSA

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(160.4236) Materials : Nanomaterials

ToC Category:
Thin Films

History
Original Manuscript: April 18, 2011
Revised Manuscript: July 12, 2011
Manuscript Accepted: July 15, 2011
Published: August 18, 2011

Citation
Tommi Kaplas, Aleksey Zolotukhin, and Yuri Svirko, "Thickness determination of graphene on metal substrate by reflection spectroscopy," Opt. Express 19, 17226-17231 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-18-17226


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References

  1. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, “Electric field effect in atomically thin carbon films,” Science306(5696), 666–669 (2004). [CrossRef] [PubMed]
  2. A. Reina, X. Jia, J. Ho, D. Nezich, H. Son, V. Bulovic, M. S. Dresselhaus, and J. Kong, “Large area, few-layer graphene films on arbitrary substrates by chemical vapor deposition,” Nano Lett.9(1), 30–35 (2009). [CrossRef] [PubMed]
  3. K. S. Kim, Y. Zhao, H. Jang, S. Y. Lee, J. M. Kim, K. S. Kim, J.-H. Ahn, P. Kim, J.-Y. Choi, and B. H. Hong, “Large-scale pattern growth of graphene films for stretchable transparent electrodes,” Nature457(7230), 706–710 (2009). [CrossRef] [PubMed]
  4. X. Li, W. Cai, J. An, S. Kim, J. Nah, D. Yang, R. Piner, A. Velamakanni, I. Jung, E. Tutuc, S. K. Banerjee, L. Colombo, and R. S. Ruoff, “Large-area synthesis of high-quality and uniform graphene films on copper foils,” Science324(5932), 1312–1314 (2009). [CrossRef] [PubMed]
  5. S. Bae, H. Kim, Y. Lee, X. Xu, J.-S. Park, Y. Zheng, J. Balakrishnan, T. Lei, H. Ri Kim, Y. I. Song, Y.-J. Kim, K. S. Kim, B. Özyilmaz, J.-H. Ahn, B. H. Hong, and S. Iijima, “Roll-to-roll production of 30-inch graphene films for transparent electrodes,” Nat. Nanotechnol.5(8), 574–578 (2010). [CrossRef] [PubMed]
  6. W. Cai, Y. Zhu, X. Li, R. D. Piner, and R. S. Ruoff, “Large area few-layer graphene/graphite films as transparent thin conducting electrodes,” Appl. Phys. Lett.95(12), 123115 (2009). [CrossRef]
  7. C. Mattevi, H. Kim, and M. Chhowalla, “A review of chemical vapour deposition of graphene on copper,” J. Mater. Chem.21(10), 3324–3334 (2011). [CrossRef]
  8. F. Bonaccorso, Z. Sun, T. Hasan, and A. C. Ferrari, “Graphene photonics and optoelectronics,” Nat. Photonics4(9), 611–622 (2010). [CrossRef]
  9. A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth, and A. K. Geim, “Raman spectrum of graphene and graphene layers,” Phys. Rev. Lett.97(18), 187401 (2006). [CrossRef] [PubMed]
  10. A. Gupta, G. Chen, P. Joshi, S. Tadigadapa, and P. C. Eklund, “Raman scattering from high-frequency phonons in supported n-graphene layer films,” Nano Lett.6(12), 2667–2673 (2006). [CrossRef] [PubMed]
  11. D. Graf, F. Molitor, K. Ensslin, C. Stampfer, A. Jungen, C. Hierold, and L. Wirtz, “Spatially resolved Raman spectroscopy of single- and few-layer graphene,” Nano Lett.7(2), 238–242 (2007). [CrossRef] [PubMed]
  12. R. R. Nair, P. Blake, A. N. Grigorenko, K. S. Novoselov, T. J. Booth, T. Stauber, N. M. R. Peres, and A. K. Geim, “Fine structure constant defines visual transparency of graphene,” Science320(5881), 1308 (2008). [CrossRef] [PubMed]
  13. M. Born and E. Wolf, Principles of Optics, 7th (expanded) ed. (Cambridge University Press, 1999).
  14. F. J. Nelson, V. K. Kamineni, T. Zhang, E. S. Comfort, J. U. Lee, and A. C. Diebold, “Optical properties of large-area polycrystalline chemical vapor deposited graphene by spectroscopic ellipsometry,” Appl. Phys. Lett.97(25), 253110 (2010). [CrossRef]
  15. E. D. Palik, Handbook of Optical Constants of Solids I (Academic press, 1998).
  16. H. Ehrenreich and H. R. Philipp, “Optical properties of Ag and Cu,” Phys. Rev.128(4), 1622–1629 (1962). [CrossRef]
  17. E. D. Palik, Handbook of Optical Constants of Solids II (Academic press, 1998).
  18. J. J. Kim and S.-K. Kim, “Optimized surface pretreatments for copper electroplating,” Appl. Surf. Sci.183(3-4), 311–318 (2001). [CrossRef]
  19. K. L. Chavez and D. W. Hess, “A novel method of etching copper oxide using acetic acid,” J. Electrochem. Soc.148(11), G640–G643 (2001). [CrossRef]
  20. L. A. Falkovsky, “Optical properties of graphene,” J. Phys.: Conf. Ser.129, 012004 (2008). [CrossRef]

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