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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 18 — Aug. 29, 2011
  • pp: 17226–17231

Thickness determination of graphene on metal substrate by reflection spectroscopy

Tommi Kaplas, Aleksey Zolotukhin, and Yuri Svirko  »View Author Affiliations

Optics Express, Vol. 19, Issue 18, pp. 17226-17231 (2011)

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We show that reflectivity measurements enable the determination of the thickness of multilayered graphene on a metal substrate. The developed technique is based on comparison of the substrate reflectance with and without graphene and relies on the strong absorbance of graphene and high refractive index contrast. We demonstrate the technique by measuring the thickness of the CVD graphene film grown on a copper substrate.

© 2011 OSA

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(160.4236) Materials : Nanomaterials

ToC Category:
Thin Films

Original Manuscript: April 18, 2011
Revised Manuscript: July 12, 2011
Manuscript Accepted: July 15, 2011
Published: August 18, 2011

Tommi Kaplas, Aleksey Zolotukhin, and Yuri Svirko, "Thickness determination of graphene on metal substrate by reflection spectroscopy," Opt. Express 19, 17226-17231 (2011)

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