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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 20 — Sep. 26, 2011
  • pp: 18833–18841

Electron wave packet sampling with laser-generated extreme ultraviolet and terahertz fields

Bernd Schütte, Ulrike Frühling, Marek Wieland, Armin Azima, and Markus Drescher  »View Author Affiliations


Optics Express, Vol. 19, Issue 20, pp. 18833-18841 (2011)
http://dx.doi.org/10.1364/OE.19.018833


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Abstract

We report on transferring the concept of light-field streaking with intense terahertz fields from free-electron lasers to the laboratory scale. Utilizing a commercial laser system, synchronized 300μm terahertz and 13nm extreme ultraviolet pulses are generated by optical rectification and high harmonic generation, respectively. The terahertz fields are sufficiently strong to support electron wave packet sampling with a few fs resolution. The capability of this approach is demonstrated by measuring the duration of electron pulses formed by direct photoemission from a neon gas target.

© 2011 OSA

OCIS Codes
(040.7480) Detectors : X-rays, soft x-rays, extreme ultraviolet (EUV)
(190.2620) Nonlinear optics : Harmonic generation and mixing
(320.2250) Ultrafast optics : Femtosecond phenomena
(020.2649) Atomic and molecular physics : Strong field laser physics

ToC Category:
Ultrafast Optics

History
Original Manuscript: June 28, 2011
Revised Manuscript: August 2, 2011
Manuscript Accepted: August 4, 2011
Published: September 13, 2011

Citation
Bernd Schütte, Ulrike Frühling, Marek Wieland, Armin Azima, and Markus Drescher, "Electron wave packet sampling with laser-generated extreme ultraviolet and terahertz fields," Opt. Express 19, 18833-18841 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-20-18833


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