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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 20 — Sep. 26, 2011
  • pp: 19050–19060

X-ray optics simulation using Gaussian superposition technique

Mourad Idir, Moisés Cywiak, Arquímedes Morales, and Mohammed H. Modi  »View Author Affiliations


Optics Express, Vol. 19, Issue 20, pp. 19050-19060 (2011)
http://dx.doi.org/10.1364/OE.19.019050


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Abstract

We present an efficient method to perform x-ray optics simulation with high or partially coherent x-ray sources using Gaussian superposition technique. In a previous paper, we have demonstrated that full characterization of optical systems, diffractive and geometric, is possible by using the Fresnel Gaussian Shape Invariant (FGSI) previously reported in the literature. The complex amplitude distribution in the object plane is represented by a linear superposition of complex Gaussians wavelets and then propagated through the optical system by means of the referred Gaussian invariant. This allows ray tracing through the optical system and at the same time allows calculating with high precision the complex wave-amplitude distribution at any plane of observation. This technique can be applied in a wide spectral range where the Fresnel diffraction integral applies including visible, x-rays, acoustic waves, etc. We describe the technique and include some computer simulations as illustrative examples for x-ray optical component. We show also that this method can be used to study partial or total coherence illumination problem.

© 2011 OSA

OCIS Codes
(340.0340) X-ray optics : X-ray optics
(340.6720) X-ray optics : Synchrotron radiation
(340.7470) X-ray optics : X-ray mirrors

ToC Category:
X-ray Optics

History
Original Manuscript: June 23, 2011
Revised Manuscript: August 3, 2011
Manuscript Accepted: August 3, 2011
Published: September 15, 2011

Citation
Mourad Idir, Moisés Cywiak, Arquímedes Morales, and Mohammed H. Modi, "X-ray optics simulation using Gaussian superposition technique," Opt. Express 19, 19050-19060 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-20-19050


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