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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 22 — Oct. 24, 2011
  • pp: 21739–21747

Fringe projection profilometry based on a novel phase shift method

Yanjun Fu and Qian Luo  »View Author Affiliations


Optics Express, Vol. 19, Issue 22, pp. 21739-21747 (2011)
http://dx.doi.org/10.1364/OE.19.021739


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Abstract

Fringe projection profilometry is generally used to measure the 3D shape of an object. In oblique-angle projection, the grating fringe cycle is broadened on the reference surface. A well-fitted, convenient, and quick cycle correction method is proposed in this study. Based on the proposed method, an accurate four-step phase shift method is developed. Comparative experiments show that the fringe projection profilometry based on the novel phase shift method can eliminate cycle error and significantly improve measurement accuracy. The relative error of the measurement is less than 1.5%. This method can be widely employed for measuring large objects.

© 2011 OSA

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: September 7, 2011
Revised Manuscript: October 5, 2011
Manuscript Accepted: October 14, 2011
Published: October 19, 2011

Citation
Yanjun Fu and Qian Luo, "Fringe projection profilometry based on a novel phase shift method," Opt. Express 19, 21739-21747 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-22-21739


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