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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 23 — Nov. 7, 2011
  • pp: 22684–22691

Characterization of Femtosecond laser-irradiation crystallization and structure of multiple periodic Si/Sb80Te20 nanocomposite films by coherent phonon spectroscopy

Weiling Zhu, Changzhou Wang, Mingcheng Sun, Simian Li, Jiwei Zhai, and Tianshu Lai  »View Author Affiliations


Optics Express, Vol. 19, Issue 23, pp. 22684-22691 (2011)
http://dx.doi.org/10.1364/OE.19.022684


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Abstract

Multiple parameters of nanocomposite Si/Sb80Te20 multilayer films are possibly optimized simultaneously to satisfy the development of ideal phase-change memory devices by adjusting chemical composition and physical structure of multilayer films. The crystallization and structure of the films are studied by coherent phonon spectroscopy. Laser irradiation power dependence of coherent optical phonon spectroscopy reveals laser-induced crystallization of the amorphous multilayer film, while coherent acoustic phonon spectroscopy reveals the presence of folded acoustic phonons which suggests a good periodic structure of the multilayer films. Laser irradiation-induced crystallization shows applicable potentials of the multilayer films in optical phase change storage.

© 2011 OSA

OCIS Codes
(160.2900) Materials : Optical storage materials
(210.4770) Optical data storage : Optical recording
(300.6500) Spectroscopy : Spectroscopy, time-resolved
(320.7130) Ultrafast optics : Ultrafast processes in condensed matter, including semiconductors

ToC Category:
Optical Data Storage

History
Original Manuscript: September 21, 2011
Revised Manuscript: October 17, 2011
Manuscript Accepted: October 17, 2011
Published: October 26, 2011

Citation
Weiling Zhu, Changzhou Wang, Mingcheng Sun, Simian Li, Jiwei Zhai, and Tianshu Lai, "Characterization of Femtosecond laser-irradiation crystallization and structure of multiple periodic Si/Sb80Te20 nanocomposite films by coherent phonon spectroscopy," Opt. Express 19, 22684-22691 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-23-22684


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