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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 23 — Nov. 7, 2011
  • pp: 23042–23053

Efficient terahertz en-face imaging

Stefan Katletz, Michael Pfleger, Harald Pühringer, Nico Vieweg, Benedikt Scherger, Bernd Heinen, Martin Koch, and Karin Wiesauer  »View Author Affiliations

Optics Express, Vol. 19, Issue 23, pp. 23042-23053 (2011)

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In this work, we develop a pulsed terahertz imaging system in reflection geometry, where due to scanning of the terahertz beam neither the sample nor the emitter and detector have to be moved. We use a two mirror galvanoscanner for deflecting the beam, in combination with a single rotationally symmetric focusing lens. In order to efficiently image planar structures, we develop an advanced scanning routine that resolves all bending effects of the imaging plane already during measurement. Thus, the measurement time is reduced, and efficient imaging of surfaces and interfaces becomes possible. We demonstrate the potential of this method in particular for a plastic-metal composite sample, for which non-destructive evaluation of an interface is performed.

© 2011 OSA

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Imaging Systems

Original Manuscript: August 8, 2011
Revised Manuscript: September 28, 2011
Manuscript Accepted: September 28, 2011
Published: October 28, 2011

Stefan Katletz, Michael Pfleger, Harald Pühringer, Nico Vieweg, Benedikt Scherger, Bernd Heinen, Martin Koch, and Karin Wiesauer, "Efficient terahertz en-face imaging," Opt. Express 19, 23042-23053 (2011)

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